Physics Commons^™

Measurement Of Electron Density And Temperature From Laser-Induced Nitrogen Plasma At Elevated Pressure (1–6 Bar), Ashwin P. Rao [*], Mark Gragston, Anil K. Patnaik, Paul S. Hsu, Michael B. Shattan

Faculty Publications

Laser-induced plasmas experience Stark broadening and shifts of spectral lines carrying spectral signatures of plasma properties. In this paper, we report time-resolved Stark broadening measurements of a nitrogen triplet emission line at 1–6 bar ambient pressure in a pure nitrogen cell. Electron densities are calculated using the Stark broadening for different pressure conditions, which are shown to linearly increase with pressure. Additionally, using a Boltzmann fit for the triplet, the electron temperature is calculated and shown to decrease with increasing pressure. The rate of plasma cooling is observed to increase with pressure. The reported Stark broadening based plasma diagnostics in …

Visualization Of Optical Wave Propagation In Femtosecond Photoemission Electron Microscopy, Rolf Kӧnenkamp, Robert Campbell Word, Joseph Fitzgerald

Physics Faculty Publications and Presentations

Photoemission electron microscopy (PEEM) combines in a unique way photon probing and electron imaging. The imaging electrons are generated in a photoelectric process by illuminating the sample with ultra-violet or x-ray light. After generation these electrons are accelerated and introduced into an electron-optical system to produce a microscopic image of the specimen surface. The advantages of PEEM are manifold:

The avoidance of electron beam exposure makes PEEM a much gentler method than standard electron microscopy. This advantage is important when fragile organic or biological structures are studied. PEEM is also highly surface sensitive, since the photoelectrons typically escape the sample …