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Synchrotron Radiation-Based Characterization Of Gan- Based Mqw Structures And Strongly Correlated Materials, Sean M. O'Malley
Synchrotron Radiation-Based Characterization Of Gan- Based Mqw Structures And Strongly Correlated Materials, Sean M. O'Malley
Dissertations
The following dissertation applies synchrotron radiation-based characterization techniques to the fields of gallium nitrides, multiferroic manganites, and self-assembled nano-domain oxide films. These material systems were chosen due to their unusual properties and potential device applications, which have made them very attractive to the scientific community.
Synchrotron-based High Resolution X-ray Diffraction (HRXRD) was used to characterize the structural properties of GaN-based multiple quantum well (MQW) structures grown on trapezoidal shaped GaN ridges. Results where interpreted within the framework of vapor-phase diffusion and surface-migration effects during the metalorganic vapor phase epitaxial growth. The relatively short diffusion length of group- III precursors and …