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Full-Text Articles in Physics
Analysis Of Beam Deflection Measurements In The Presence Of Linear Absorption, Manuel R. Ferdinandus, Jennifer Reed, Kent L. Averett, F. Kenneth Hopkins, Augustine Urbas
Analysis Of Beam Deflection Measurements In The Presence Of Linear Absorption, Manuel R. Ferdinandus, Jennifer Reed, Kent L. Averett, F. Kenneth Hopkins, Augustine Urbas
Faculty Publications
We develop a series of analytical approximations allowing for rapid extraction of the nonlinear parameters from beam deflection measurements. We then apply these approximations to the analysis of cadmium silicon phosphide and compare the results against previously published parameter extraction methods and find good agreement for typical experimental conditions.
Index Of Refraction From The Near-Ultraviolet To The Near-Infrared From A Single Crystal Microwave-Assisted Cvd Diamond, Giorgio Turri, Scott Webster, Ying Chen, Benjamin Wickham, Andrew Bennett, Michael Bass
Index Of Refraction From The Near-Ultraviolet To The Near-Infrared From A Single Crystal Microwave-Assisted Cvd Diamond, Giorgio Turri, Scott Webster, Ying Chen, Benjamin Wickham, Andrew Bennett, Michael Bass
Publications
The refractive index of a type IIa CVD-grown single-crystal diamond was measured by ellipsometry from the near ultraviolet to the near infrared region of the spectrum. As a consequence, a one term Sellmeier Equation with coefficents of B-1 = 4.658 and C-1 = 112.5 for the refractive index of diamond, for the wavelength range from 300 to 1650 nm, was derived that is only as accurate as the input data, +/- 0.002. The experimental results in this paper between 800 and 1650 nm are new, adding to the values available in the literature.