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Application Of Phase Shifting Electronic Speckle Pattern Interferometry In Studies Of Photoinduced Shrinkage Of Photopolymer Layers, Mohesh Moothanchery, Viswanath Bavigadda, Manojit Pramanik, Vincent Toal, Izabela Naydenova
Application Of Phase Shifting Electronic Speckle Pattern Interferometry In Studies Of Photoinduced Shrinkage Of Photopolymer Layers, Mohesh Moothanchery, Viswanath Bavigadda, Manojit Pramanik, Vincent Toal, Izabela Naydenova
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Photoinduced shrinkage occurring in photopolymer layers during holographic recording was determined by Phase Shifting Electronic Speckle Pattern Interferometry. Phase maps were calculated from the changes in intensity at each pixel due to the phase differences introduced between object and reference beams. Shrinkage was then obtained from the changes in phase as recording proceeded. The technique allows for whole field measurement of the dimensional changes in photopolymers during holographic recording.