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Photoemission Electron Microscopy For Analysis Of Dielectric Structures And The Goos-Hänchen Shift, Theodore Axel Stenmark

Dissertations and Theses

Photoemission Electron Microscopy (PEEM) is a versatile tool that relies on the photoelectric effect to produce high-resolution electron images. Ultrafast pulse lasers allow for multi-photon PEEM where multiple visible or IR photons excite a single electron in a nonlinear process. The photoelectron yield in both cases is related to the near-field region of electromagnetic fields at the surface of the sample. We use this ability here to analyze wave propagation in a linear dielectric waveguide with wavelengths of 410 nm and 780 nm. The propagation constant of the waveguide can be extracted from interference patterns created by light propagating in …