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Full-Text Articles in Physics
Temperature Dependent Surface Reconstruction Of Freely Suspended Films Of 4-N-Heptyloxybenzylidene-4-N-Heptylaniline, Daniel E. Martinez Zambrano
Temperature Dependent Surface Reconstruction Of Freely Suspended Films Of 4-N-Heptyloxybenzylidene-4-N-Heptylaniline, Daniel E. Martinez Zambrano
Lawrence University Honors Projects
Surfaces of freely suspended thick films of 4-n-heptyloxybenzylidene-4-n-heptylaniline (7O.7) in the crystalline-B phase have been imaged using non-contact mode atomic force microscopy. Steps are observed on the surface of the film with a height of 3.0 +/- 0.1 nm corresponding to the upright molecular length of 7O.7. In addition, we find that the step width varies with temperature between 56 and 59 degrees C. The steps are many times wider than the molecular length, suggesting that the steps are not on the surface but instead originate from edge dislocations in the interior. Using a strain model for liquid crystalline layers …
Properties Of Cu(In,Ga,Al)Se² Thin Films Fabricated By Magnetron Sputtering, Talaat A. Hameed, Wei Cao, Bahiga A. Mansour, Inas K. Elzawaway, El-Metwally M. Abdelrazek, Hani E. Elsayed-Ali
Properties Of Cu(In,Ga,Al)Se² Thin Films Fabricated By Magnetron Sputtering, Talaat A. Hameed, Wei Cao, Bahiga A. Mansour, Inas K. Elzawaway, El-Metwally M. Abdelrazek, Hani E. Elsayed-Ali
Applied Research Center Publications
Cu (In,Ga,Al)Se2 (CIGAS) thin films were studied as an alternative absorber layer material to Cu(InxGa1-x)Se2. CIGAS thin films with varying Al content were prepared by magnetron sputtering on Si(100) and soda-lime glass substrates at 350 °C, followed by postdeposition annealing at 520 °C for 5 h in vacuum. The film composition was measured by an electron probe microanalyzer while the elemental depth profiles were determined by secondary ion mass spectrometry. X-ray diffraction studies indicated that CIGAS films are single phase with chalcopyrite structure and that the (112) peak clearly shifts to higher 2θ …