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Articles 1 - 5 of 5
Full-Text Articles in Physics
Use Of A Novel Infrared Wavelength-Tunable Laser Mueller-Matrix Polarimetric Scatterometer To Measure Nanostructured Optical Materials, Jason C. Vap, Stephen E. Nauyoks, Michael R. Benson, Michael A. Marciniak
Use Of A Novel Infrared Wavelength-Tunable Laser Mueller-Matrix Polarimetric Scatterometer To Measure Nanostructured Optical Materials, Jason C. Vap, Stephen E. Nauyoks, Michael R. Benson, Michael A. Marciniak
Faculty Publications
Nanostructured optical materials, for example, metamaterials, have unique spectral, directional, and polarimetric properties. Samples designed and fabricated for infrared (IR) wavelengths have been characterized using broadband instruments to measure specular polarimetric transmittance or reflectance as in ellipsometry or integrated hemisphere transmittance or reflectance. We have developed a wavelength-tunable IR Mueller-matrix (Mm) polarimetric scatterometer which uses tunable external-cavity quantum-cascade lasers (EC-QCLs) to tune onto and off of the narrowband spectral resonances of nanostructured optical materials and performed full polarimeteric and directional evaluation to more fully characterize their behavior. Using a series of EC-QCLs, the instrument is tunable over 4.37-6.54 μm wavelengths …
Synthesis Of Non-Uniformly Correlated Partially Coherent Sources Using A Deformable Mirror, Milo W. Hyde Iv, Santasri Bose-Pillai, Ryan A. Wood
Synthesis Of Non-Uniformly Correlated Partially Coherent Sources Using A Deformable Mirror, Milo W. Hyde Iv, Santasri Bose-Pillai, Ryan A. Wood
Faculty Publications
The near real-time synthesis of a non-uniformly correlated partially coherent source using a low-actuator-count deformable mirror is demonstrated. The statistical optics theory underpinning the synthesis method is reviewed. The experimental results of a non-uniformly correlated source are presented and compared to theoretical predictions. A discussion on how deformable mirror characteristics such as actuator count and pitch affect source generation is also included.
Electron Paramagnetic Resonance Study Of Neutral Mg Acceptors In Β-Ga2O3 Crystals, Brant E. Kananen, Larry E. Halliburton, Elizabeth M. Scherrer, K. T. Stevens, G. K. Foundos, K. B. Chang, Nancy C. Giles
Electron Paramagnetic Resonance Study Of Neutral Mg Acceptors In Β-Ga2O3 Crystals, Brant E. Kananen, Larry E. Halliburton, Elizabeth M. Scherrer, K. T. Stevens, G. K. Foundos, K. B. Chang, Nancy C. Giles
Faculty Publications
Electron paramagnetic resonance (EPR) is used to directly observe and characterize neutral Mg acceptors (Mg0Ga) in a β-Ga2O3 crystal. These acceptors, best considered as small polarons, are produced when the Mg-doped crystal is irradiated at or near 77 K with x rays. During the irradiation, neutral acceptors are formed when holes are trapped at singly ionized Mg acceptors (Mg−Ga). Unintentionally present Fe3+ (3d5) and Cr3+ (3d3) transition-metal ions serve as the corresponding electron traps. The hole is localized in a nonbonding p orbital on a threefold-coordinated oxygen ion …
On-Chip, High-Sensitivity Temperature Sensors Based On Dye-Doped Solid-State Polymer Microring Lasers, Lei Wan, Hengky Chandrahalim, Cong Chen, Qiushu Chen, Ting Mei, Yuji Oki, Naoya Nishimura, Lingjie Jay Guo, Xudong Fan
On-Chip, High-Sensitivity Temperature Sensors Based On Dye-Doped Solid-State Polymer Microring Lasers, Lei Wan, Hengky Chandrahalim, Cong Chen, Qiushu Chen, Ting Mei, Yuji Oki, Naoya Nishimura, Lingjie Jay Guo, Xudong Fan
Faculty Publications
We developed a chip-scale temperature sensor with a high sensitivity of 228.6 pm/°C based on a rhodamine 6G (R6G)-doped SU-8 whispering-gallery mode microring laser. The optical mode was largely distributed in a polymer core layer with a 30 μm height that provided detection sensitivity, and the chemically robust fused-silica microring resonator host platform guaranteed its versatility for investigating different functional polymer materials with different refractive indices. As a proof of concept, a dye-doped hyperbranched polymer (TZ-001) microring laser-based temperature sensor was simultaneously developed on the same host wafer and characterized using a free-space optics measurement setup. Compared to TZ-001, the …
Measuring The Reflection Matrix Of A Rough Surface, Kenneth W. Burgi, Michael A. Marciniak, Mark E. Oxley, Stephen E. Nauyoks
Measuring The Reflection Matrix Of A Rough Surface, Kenneth W. Burgi, Michael A. Marciniak, Mark E. Oxley, Stephen E. Nauyoks
Faculty Publications
Phase modulation methods for imaging around corners with reflectively scattered light required illumination of the occluded scene with a light source either in the scene or with direct line of sight to the scene. The RM (reflection matrix) allows control and refocusing of light after reflection, which could provide a means of illuminating an occluded scene without access or line of sight. Two optical arrangements, one focal-plane, the other an imaging system, were used to measure the RM of five different rough-surface reflectors. Intensity enhancement values of up to 24 were achieved. Surface roughness, correlation length, and slope were examined …