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Full-Text Articles in Physics

Enhanced Metallic Properties Of Srruo3 Thin Films Via Kinetically Controlled Pulsed Laser Epitaxy, Justin K. Thompson, J. Nichols, S. Lee, S. Ryee, John H. Gruenewald, John G. Connell, Maryam Souri, J. M. Johnson, J. Hwang, M. J. Han, H. N. Lee, D. -W. Kim, Sung S. Ambrose Seo Oct 2016

Enhanced Metallic Properties Of Srruo3 Thin Films Via Kinetically Controlled Pulsed Laser Epitaxy, Justin K. Thompson, J. Nichols, S. Lee, S. Ryee, John H. Gruenewald, John G. Connell, Maryam Souri, J. M. Johnson, J. Hwang, M. J. Han, H. N. Lee, D. -W. Kim, Sung S. Ambrose Seo

Physics and Astronomy Faculty Publications

Metal electrodes are a universal element of all electronic devices. Conducting SrRuO3 (SRO) epitaxial thin films have been extensively used as electrodes in complex-oxide heterostructures due to good lattice mismatches with perovskite substrates. However, when compared to SRO single crystals, SRO thin films have shown reduced conductivity and Curie temperatures (TC), which can lead to higher Joule heating and energy loss in the devices. Here, we report that high-quality SRO thin films can be synthesized by controlling the plume dynamics and growth rate of pulsed laser epitaxy (PLE) with real-time optical spectroscopic monitoring. The SRO thin …


Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal Apr 2015

Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal

Krishna C. Mandal

No abstract provided.


Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal Apr 2015

Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal

Krishna C. Mandal

No abstract provided.


Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal Apr 2015

Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal

Krishna C. Mandal

No abstract provided.


Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal Mar 2007

Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal

Faculty Publications

No abstract provided.