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Full-Text Articles in Physics
Methods For Preparing And Characterizing Granular Materials For Electron Yield Measurements, Tom Keaton
Methods For Preparing And Characterizing Granular Materials For Electron Yield Measurements, Tom Keaton
All Graduate Plan B and other Reports, Spring 1920 to Spring 2023
This work presents a systematic study on sample preparation methods and accuracy of electron yield (EY) measurements of highly insulating, granular materials. EY measurements of highly insulating materials, especially those with high EY, are challenging due to the effects of sample charging even for very low fluence electron probe beams. EY measurements of particulates are complicated by: (i) roughness effects from particulate size, shape, coverage, and compactness; (ii) particle adhesion; (iii) substrate contributions; and (iv) electrostatic repulsion and potential barriers from charged particles and substrates. Numerous methods were explored to rigidly affix particles on conducting substrates at varying coverages for …
Cathodoluminescence Studies Of Defects In Coated Boron Nitride, Kévin Guerch, Justin Dekany, Jr Dennison, Thierry Paulmier, Sophie Guillemet-Fritsch, Pascal Lenormand
Cathodoluminescence Studies Of Defects In Coated Boron Nitride, Kévin Guerch, Justin Dekany, Jr Dennison, Thierry Paulmier, Sophie Guillemet-Fritsch, Pascal Lenormand
Journal Articles
Optical emission properties of Boron Nitride (BN) substrates, BN with alumina (Al2O3) coating, and thermally-annealed alumina-coated boron nitride (an-BN/Al2O3) were investigated under electron irradiation using cathodoluminescence (CL) measurements. Tests were performed temperatures ranging from ~100 K to ~300 K, with monoenergetic beams from 5 keV to 30 keV, and electron flux densities from 1 nA.cm-2 to 500 nA.cm-2. These experiments were conducted to identify the effects of coating and thermal annealing on the nature and occupation of defect states in different samples with BN substrates. Previous studies have shown that these treatments can limit the charging of BN substrates. Consequently, …
Electrical Properties Of Annealed And Coated Boron Nitride Under Electron Beam Irradiation, Kevin Guerch, Theirry Paulmier, Jr Dennison, Justin Dekany, Pascal Lenormand, Sophie Guillemet-Fritsch
Electrical Properties Of Annealed And Coated Boron Nitride Under Electron Beam Irradiation, Kevin Guerch, Theirry Paulmier, Jr Dennison, Justin Dekany, Pascal Lenormand, Sophie Guillemet-Fritsch
Journal Articles
The charging and relaxation kinetics of pyrolytic boron nitride (BN) substrates, BN with an aluminium oxide (BN/Al2O3) coating, and thermally-annealed alumina-coated boron nitride (an-BN/Al2O3) were investigated under low power electron irradiation (5 < E0 < 20 keV, Ji = 10 nA.cm-2 at room temperature) in the CEDRE facility at ONERA (Toulouse, France). Surface potentials of each ceramics configuration were measured over time using the Kelvin probe method. The influence of coating and annealing treatments to limit charging is discussed in this paper. A thorough study of a an–BN/Al2O3 sample was carried out …
Electron-Induced Electron Yields Of Uncharged Insulating Materials, Ryan Carl Hoffmann
Electron-Induced Electron Yields Of Uncharged Insulating Materials, Ryan Carl Hoffmann
All Graduate Theses and Dissertations, Spring 1920 to Summer 2023
Presented here are electron-induced electron yield measurements from high-resistivity, high-yield materials to support a model for the yield of uncharged insulators. These measurements are made using a low-fluence, pulsed electron beam and charge neutralization to minimize charge accumulation. They show charging induced changes in the total yield, as much as 75%, even for incident electron fluences of <3 fC/mm2, when compared to an uncharged yield. The evolution of the yield as charge accumulates in the material is described in terms of electron recapture, based on the extended Chung and Everhart model of the electron emission spectrum and the dual dynamic …
Low-Fluence Electron Yields Of Highly Insulating Materials, Ryan Hoffmann, Jr Dennison, Clint D. Thomson, Jennifer Albretson
Low-Fluence Electron Yields Of Highly Insulating Materials, Ryan Hoffmann, Jr Dennison, Clint D. Thomson, Jennifer Albretson
Journal Articles
Electron-induced electron yields of high-resistivity, high-yield materials - ceramic polycrystalline aluminum oxide and the polymer polyimide (Kapton HN), - were made by using a low-fluence, pulsed incident electron beam and charge neutralization electron source to minimize charge accumulation. Large changes in energy-dependent total yield curves and yield decay curves were observed, even for incident electron fluences of <3 fC/mm2. The evolution of the electron yield as charge accumulates in the material is modeled in terms of electron re-capture based on an extended Chung-Everhart model of the electron emission spectrum. This model is used to explain anomalies measured in highly insulating, …