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Structure Inhomogeneities, Shallow Defects, And Charge Transport In The Series Of Thermoelectric Materials K2bi8−Xsbxse13, Jeffrey S. Dyck, T. Kyratski, E. Hatzikraniotis, K. M. Paraskevopoulos, C. D. Malliakas, C. Uher, M. G. Kanatzidis

Physics

The charge transport properties of the low-dimensional thermoelectric materials K₂Bi_8-xSb_xSe₁₃ (02Bi_8-xSb_xSe₁₃ was analyzed on the basis of the classical semiconductor theory and discussed in the context of recent band calculations. The results suggest that the K₂Bi_8-xSb_xSe₁₃ materials possess coexisting domains with semimetallic and semiconducting characters whose ratio is influenced by the value of x and by local defects. The extent and relative distribution of these domains control the charge transport properties. Electron diffraction experiments performed on samples of K_{2 …}