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Development Of A Fourier Transform-Based Time-Of-Flight Electron Spectrometer With Ultra-High Resolution, Brian Frederick, Peter H. Kleban
Development Of A Fourier Transform-Based Time-Of-Flight Electron Spectrometer With Ultra-High Resolution, Brian Frederick, Peter H. Kleban
University of Maine Office of Research Administration: Grant Reports
This project, funded by the Major Research Instrumentation program, will develop a time-of-flight electron velocity analyzer using advanced modulation and Fourier deconvolution techniques with a throughput advantage on the order of 1000 over existing instruments. The new spectrometer will operate with ultra-high resolution in the energy range 1-1000 electron volts. It will be useful for the investigation of surface properties under ultra-high vacuum and a variety of other scientific and commercial applications. The device utilizes secondary chopping of the electron beam in the nanosecond or sub-nanosecond time regime, and state-of-the-art Fourier transform-based digital signal recovery methods. Additionally, there is potential …