Mathematics Commons^™

Length Bias In The Measurements Of Carbon Nanotubes, Paul H. Kvam

Department of Math & Statistics Faculty Publications

To measure carbon nanotube lengths, atomic force microscopy and special software are used to identify and measure nanotubes on a square grid. Current practice does not include nanotubes that cross the grid, and, as a result, the sample is length-biased. The selection bias model can be demonstrated through Buffon’s needle problem, extended to general curves that more realistically represent the shape of nanotubes observed on a grid. In this article, the nonparametric maximum likelihood estimator is constructed for the length distribution of the nanotubes, and the consequences of the length bias are examined. Probability plots reveal that the corrected length …

Statistical Reliability With Applications, Paul H. Kvam, Jye-Chyi Lu

Department of Math & Statistics Faculty Publications

This chapter reviews fundamental ideas in reliability theory and inference. The first part of the chapter accounts for lifetime distributions that are used in engineering reliability analyis, including general properties of reliability distributions that pertain to lifetime for manufactured products. Certain distributions are formulated on the basis of simple physical properties, and other are more or less empirical. The first part of the chapter ends with a description of graphical and analytical methods to find appropriate lifetime distributions for a set of failure data.

The second part of the chapter describes statistical methods for analyzing reliability data, including maximum likelihood …