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Articles 1 - 8 of 8
Full-Text Articles in Mathematics
Asymptotic Behavior Of Linearized Viscoelastic Flow Problem, Yinnian He, Yi Li
Asymptotic Behavior Of Linearized Viscoelastic Flow Problem, Yinnian He, Yi Li
Yi Li
In this article, we provide some asymptotic behaviors of linearized viscoelastic flows in a general two-dimensional domain with certain parameters small and the time variable large.
Asymptotic Behavior Of Linearized Viscoelastic Flow Problem, Yinnian He, Yi Li
Asymptotic Behavior Of Linearized Viscoelastic Flow Problem, Yinnian He, Yi Li
Mathematics and Statistics Faculty Publications
In this article, we provide some asymptotic behaviors of linearized viscoelastic flows in a general two-dimensional domain with certain parameters small and the time variable large.
The Signed-Graphic Representations Of Wheels And Whirls, Dan Slilaty, Hongxun Qin
The Signed-Graphic Representations Of Wheels And Whirls, Dan Slilaty, Hongxun Qin
Mathematics and Statistics Faculty Publications
We characterize all of the ways to represent the wheel matroids and whirl matroids using frame matroids of signed graphs. The characterization of wheels is in terms of topological duality in the projective plane and the characterization of whirls is in terms of topological duality in the annulus.
Connectivity In Frame Matroids, Dan Slilaty, Hongxun Qin
Connectivity In Frame Matroids, Dan Slilaty, Hongxun Qin
Mathematics and Statistics Faculty Publications
We discuss the relationship between the vertical connectivity of a biased graph Ω and the Tutte connectivity of the frame matroid of Ω (also known as the bias matroid of Ω).
Length Bias In The Measurements Of Carbon Nanotubes, Paul H. Kvam
Length Bias In The Measurements Of Carbon Nanotubes, Paul H. Kvam
Department of Math & Statistics Faculty Publications
To measure carbon nanotube lengths, atomic force microscopy and special software are used to identify and measure nanotubes on a square grid. Current practice does not include nanotubes that cross the grid, and, as a result, the sample is length-biased. The selection bias model can be demonstrated through Buffon’s needle problem, extended to general curves that more realistically represent the shape of nanotubes observed on a grid. In this article, the nonparametric maximum likelihood estimator is constructed for the length distribution of the nanotubes, and the consequences of the length bias are examined. Probability plots reveal that the corrected length …
Load Sharing Models, Paul H. Kvam, Jye-Chyi Lu
Load Sharing Models, Paul H. Kvam, Jye-Chyi Lu
Department of Math & Statistics Faculty Publications
Consider a system of components whose lifetimes are governed by a probability distribution. Load sharing refers to a model of stochastic interdependency between components that operate within a system. If components are set up in a parallel system (see Parallel, Series, and Series–Parallel Systems) for example, the system survives as long as at least one component is operating. In a typical load-sharing system, once a component fails, the remaining components suffer an increase in failure rate due to the extra “load” they must encumber due to the failed component.
Degradation Models, Suk Joo Bae, Paul H. Kvam
Degradation Models, Suk Joo Bae, Paul H. Kvam
Department of Math & Statistics Faculty Publications
Reliability testing typically generates product lifetime data, but for some tests, covariate information about the wear and tear on the product during the life test can provide additional insight into the product’s lifetime distribution. This usage, or degradation, can be the physical parameters of the product (e.g., corrosion thickness on a metal plate) or merely indicated through product performance (e.g., the luminosity of a light emitting diode). The measurements made across the product’s lifetime are degradation data, and degradation analysis is the statistical tool for providing inference about the lifetime distribution from the degradation data.
Origin Of Conductive Surface Layer In Annealed Zno, David C. Look, B. Claflin, Helen Smith
Origin Of Conductive Surface Layer In Annealed Zno, David C. Look, B. Claflin, Helen Smith
Mathematics and Statistics Faculty Publications
The highly conductive surface layers found in nearly all as-grown or annealed bulk ZnO wafers are studied by temperature-dependent Hall-effect and secondary-ion mass spectroscopy (SIMS) measurements. In this work, we have used annealing in N2 at 900 degrees C, and forming gas (5% H2 in N2) at 600 degrees C, to cause a large enough surface conduction that SIMS measurements can be reliably employed. The increased near-surface donor density, as determined from two-layer Hall-effect modeling, is consistent with an increased near-surface concentration of Al, Ga, and In atoms, resulting from diffusion. There is no evidence for …