Chemistry Commons^™

Impedance Feedback Control For Scanning Electrochemical Microscopy, David O. Wipf, Mario A. Apuche-Avlles

College of Arts and Sciences Publications and Scholarship

A new constant-distance imaging method based on the relationship between tip impedance and tip-substrate separation has been developed for the scanning electrochemical microscope (SECM). The tip impedance is monitored by application of a high frequency ac voltage bias between the tip and auxiliary electrode. The high frequency ac current is easily separated from the dc level faradaic electrochemistry with a simple RC filter, which allows impedance measurements during feedback or generation/collection experiments. By employing a piezo-based feedback controller we are able to maintain the impedance at a constant value and, thus, maintain a constant tip-substrate separation. Application of the method …