Applied Mathematics Commons^™

Measuring The Reflection Matrix Of A Rough Surface, Kenneth W. Burgi, Michael A. Marciniak, Mark E. Oxley, Stephen E. Nauyoks

Faculty Publications

Phase modulation methods for imaging around corners with reflectively scattered light required illumination of the occluded scene with a light source either in the scene or with direct line of sight to the scene. The RM (reflection matrix) allows control and refocusing of light after reflection, which could provide a means of illuminating an occluded scene without access or line of sight. Two optical arrangements, one focal-plane, the other an imaging system, were used to measure the RM of five different rough-surface reflectors. Intensity enhancement values of up to 24 were achieved. Surface roughness, correlation length, and slope were examined …