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Full-Text Articles in Physical Sciences and Mathematics
Preventing Oxidation Of Aluminum Films With Cadmium Of Zinc Barriers, Spencer B. Perry
Preventing Oxidation Of Aluminum Films With Cadmium Of Zinc Barriers, Spencer B. Perry
Student Works
The planned Large UV/Optical/Near-infrared Telescope (LUVOIR) is expected to launch sometime in the 2030s if NASA surveys recommend LUVOIR over several other projects in early developmental stages [1]. As the project title suggests, the proposed telescope would include large mirrors (between 8 and 16 meters) as part of the orbiting reflector telescope. My research focused on the preparation of aluminum mirrors with zinc or cadmium barrier layers that were designed to prevent oxidation of the aluminum.
Thin Films Of Carbon Nanotubes And Nanotube/Polymer Composites, Anthony D. Willey
Thin Films Of Carbon Nanotubes And Nanotube/Polymer Composites, Anthony D. Willey
Theses and Dissertations
A method is described for ultrasonically spraying thin films of carbon nanotubes that have been suspended in organic solvents. Nanotubes were sonicated in N-Methyl-2-pyrrolidone or N-Cyclohexyl-2-pyrrolidone and then sprayed onto a heated substrate using an ultrasonic spray nozzle. The solvent quickly evaporated, leaving a thin film of randomly oriented nanotubes. Film thickness was controlled by the spray time and ranged between 200-500 nm, with RMS roughness of about 40 nm. Also described is a method for creating thin (300 nm) conductive freestanding nanotube/polymer composite films by infiltrating sprayed nanotube films with polyimide.
Electron Microscopy Characterization Of Vanadium Dioxide Thin Films And Nanoparticles, Felipe Rivera
Electron Microscopy Characterization Of Vanadium Dioxide Thin Films And Nanoparticles, Felipe Rivera
Theses and Dissertations
Vanadium dioxide (VO_2) is a material of particular interest due to its exhibited metal to insulator phase transition at 68°C that is accompanied by an abrupt and significant change in its electronic and optical properties. Since this material can exhibit a reversible drop in resistivity of up to five orders of magnitude and a reversible drop in infrared optical transmission of up to 80%, this material holds promise in several technological applications. Solid phase crystallization of VO_2 thin films was obtained by a post-deposition annealing process of a VO_{x,x approx 2} amorphous film sputtered on an amorphous silicon dioxide (SiO_2) …
Scandium Oxide Thin Films And Their Optical Properties In The Extreme Ultraviolet, Guillermo Antonio Acosta
Scandium Oxide Thin Films And Their Optical Properties In The Extreme Ultraviolet, Guillermo Antonio Acosta
Theses and Dissertations
This study reports on the physical and optical characterization of scandium oxide thin films. Thin films of scandium oxide, 20-40 nm thick, were deposited on silicon wafers, quartz slides, and silicon photodiodes by reactively sputtering scandium in an oxygen environment. These samples were characterized using ellipsometry, high-resolution transmission electron microscopy, scanning transmission electron microscopy, and energy dispersive x-ray analysis. A 28.46 nm thick scandium oxide thin film was measured in the Extreme Ultraviolet (EUV) from 2.7 to 50 nm (459.3 to 24.8 eV) using synchrotron radiation at the Advanced Light Source Beamline 6.3.2 at the Lawrence Berkeley National Laboratory. In …
Thorium-Based Thin Films As Highly Reflective Mirrors In The Euv, David D. Allred, William R. Evans, Jed E. Johnson, Richard L. Sandberg, R. Steven Turley
Thorium-Based Thin Films As Highly Reflective Mirrors In The Euv, David D. Allred, William R. Evans, Jed E. Johnson, Richard L. Sandberg, R. Steven Turley
Faculty Publications
As applications for extreme ultraviolet (EUV) radiation have been identified, the demand for better optics has also increased. Thorium and thorium oxide thin films (19 to 61 nm thick) were RF-sputtered and characterized using atomic force microscopy (AFM), spectroscopic ellipsometry, low-angle x-ray diffraction (LAXRD), x-ray photoelectron spectroscopy (XPS), and x-ray absorption near edge structure (XANES) in order to assess their capability as EUV reflectors. Their reflectance and absorption at different energies were also measured and analyzed at the Advanced Light Source in Berkeley. The reflectance of oxidized thorium is reported between 2 and 32 nm at 5, 10, and 15 …