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Full-Text Articles in Physical Sciences and Mathematics
Effect Of Mixing Ratio Of (Sno2)1-X(In2o3)X Thin Film On Gas Sensitivity, Mohammed Abdulhur Kadhim Dr., Amer Abbas Ramadhan Dr., Mohammed Oudah Salman Al-Gburi Dr, Ghiadaa J. Habi, Noora J. Hentawe
Effect Of Mixing Ratio Of (Sno2)1-X(In2o3)X Thin Film On Gas Sensitivity, Mohammed Abdulhur Kadhim Dr., Amer Abbas Ramadhan Dr., Mohammed Oudah Salman Al-Gburi Dr, Ghiadaa J. Habi, Noora J. Hentawe
Karbala International Journal of Modern Science
In this work, Nitrogen dioxide gas sensorwas manufactured from SnO2 and (SnO2)1-x(In2O3)x at different atomic ratios (x=0.05, 0.1 and 0.15) using pulsed laser deposition technique. The effect of the preparation ratio on structural properties, surface topography, optical and electrical characteristics and gas sensor efficiency were studied. The x-ray diffraction measurements showed polycrystalline structures for all samples and their crystallite size decreases with increasing the doping ratio. The AFM measurement illustrates spherical SnO2 shapes converted to filament-like shapes at x=0.1, and that the average particle diameter decreased, while the RMS …
Atomic Layer Deposition Of Zirconium Oxide Thin Film On An Optical Fiber Forcladding Light Strippers, Ali̇ Karatutlu
Atomic Layer Deposition Of Zirconium Oxide Thin Film On An Optical Fiber Forcladding Light Strippers, Ali̇ Karatutlu
Turkish Journal of Physics
Cladding light strippers are essential components in high-power fiber lasers used for removal of unwanted cladding light that can distort the beam quality or even damage the whole fiber laser system. In this study, an Atomic Layer Deposition system was used for the first time to prepare the cladding light stripper devices using a 40 nm thick zirconia layer grown on optical fiber. The thickness of the zirconia coating was confirmed using the Scanning Electron Microscopy (SEM) and the Ellipsometry techniques. The elemental analysis was also performed using the wavelength dispersive X-ray spectroscopy technique. The Raman spectroscopy and XRD data …