Operations Research, Systems Engineering and Industrial Engineering Commons^™

Yield And Reliability Analysis For Nanoelectronics, Tao Yuan

Doctoral Dissertations

As technology has continued to advance and more break-through emerge, semiconductor devices with dimensions in nanometers have entered into all spheres of our lives. Accordingly, high reliability and high yield are very much a central concern to guarantee the advancement and utilization of nanoelectronic products. However, there appear to be some major challenges related to nanoelectronics in regard to the field of reliability: identification of the failure mechanisms, enhancement of the low yields of nano products, and management of the scarcity and secrecy of available data [34]. Therefore, this dissertation investigates four issues related to the yield and reliability of …

Photogrammetry In Traffic Accident Reconstruction, Lara Lynn O’Shields

Doctoral Dissertations

The aim of this research is to utilize PhotoModeler, a closerange photogrammetry software package, in various traffic accident reconstruction applications. More specifically, three distinct studies were conducted: 1.) vehicle crush measurement, 2.) road curve measurement, and 3.) an evaluation of common traffic accident reconstruction measurement methodologies.

The first study applied the photogrammetric process to controlled crash information generated by the National Highway Traffic Safety Administration (NHTSA). A statistical procedure known as bootstrapping was utilized to generate distributions from which the variability was examined. The “within” subject analysis showed that 44.8% of the variability is due to the technique itself and …