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Full-Text Articles in Operations Research, Systems Engineering and Industrial Engineering
Yield And Reliability Analysis For Nanoelectronics, Tao Yuan
Yield And Reliability Analysis For Nanoelectronics, Tao Yuan
Doctoral Dissertations
As technology has continued to advance and more break-through emerge, semiconductor devices with dimensions in nanometers have entered into all spheres of our lives. Accordingly, high reliability and high yield are very much a central concern to guarantee the advancement and utilization of nanoelectronic products. However, there appear to be some major challenges related to nanoelectronics in regard to the field of reliability: identification of the failure mechanisms, enhancement of the low yields of nano products, and management of the scarcity and secrecy of available data [34]. Therefore, this dissertation investigates four issues related to the yield and reliability of …
The Impact Of Organizational Attributes On Project Performance As Measured By On-Time Delivery And Budget, Zeid El-Akkad
The Impact Of Organizational Attributes On Project Performance As Measured By On-Time Delivery And Budget, Zeid El-Akkad
Masters Theses
Before we determine what lean tools are suitable for an office environment and how to modify those tools to make them more suitable and in order to develop a lean office, it is important to understand the different processes and aspects within an office. For this reason, better understanding of office processes and aspects helps facilitate the deployment and implementation and modification of different lean techniques to better suit the office environment. The purpose of this paper is to identify seven different factors to compare against one another and against project performance in terms of on-time delivery and budget. The …
A New Stochastic Model For Systems Under General Repairs, Haitao Liao
A New Stochastic Model For Systems Under General Repairs, Haitao Liao
Faculty Publications and Other Works -- Industrial & Information Engineering
Numerous stochastic models for repairable systems have been developed by assuming different time trends, and re- pair effects. In this paper, a new general repair model based on the repair history is presented. Unlike the existing models, the closed- form solutions of the reliability metrics can be derived analytically by solving a set of differential equations. Consequently, the con- fidence bounds of these metrics can be easily estimated. The pro- posed model, as well as the estimation approach, overcomes the drawbacks of the existing models. The practical use of the proposed model is demonstrated by a much-discussed set of data. …