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Full-Text Articles in Nanoscience and Nanotechnology
Vi Energy-Efficient Memristor-Based Neuromorphic Computing Circuits And Systems For Radiation Detection Applications, Jorge Iván Canales Verdial
Vi Energy-Efficient Memristor-Based Neuromorphic Computing Circuits And Systems For Radiation Detection Applications, Jorge Iván Canales Verdial
Electrical and Computer Engineering ETDs
Radionuclide spectroscopic sensor data is analyzed with minimal power consumption through the use of neuromorphic computing architectures. Memristor crossbars are harnessed as the computational substrate in this non-conventional computing platform and integrated with CMOS-based neurons to mimic the computational dynamics observed in the mammalian brain’s visual cortex. Functional prototypes using spiking sparse locally competitive approximations are presented. The architectures are evaluated for classification accuracy and energy efficiency. The proposed systems achieve a 90% true positive accuracy with a high-resolution detector and 86% with a low-resolution detector.
Optical Angular Scatterometry: In-Line Approach For Roll-2-Roll And Nano-Imprint Fabrication Systems, Juan Jose Faria-Briceno
Optical Angular Scatterometry: In-Line Approach For Roll-2-Roll And Nano-Imprint Fabrication Systems, Juan Jose Faria-Briceno
Electrical and Computer Engineering ETDs
As critical dimensions continue to shrink and structures become more complex, metrology processes are challenging to implement during in-line nanomanufacturing. Non-destructive, non-contact, and high-speed conditions are required to achieve proper metrology processes during in-line manufacturing. Optical scatterometry is a nanoscale metrology tool widely used in integrated circuit manufacturing for characterization and quality control. However, most applications of optical scatterometry operate off-line. A high-speed, in-line, non-contact, non-destructive scatterometry angular system has been demonstrated in this work to scan pattern surfaces during real-time nano-fabrication.
Our system has demonstrated scanning capabilities using flat, 1D and 2D complex structures. The flat surface samples consist …