Nanoscience and Nanotechnology Commons^™

Mitigation Of Electromigration In Metal Interconnects Passivated By Ångstrom-Thin 2d Materials, Yunjo Jeong

USF Tampa Graduate Theses and Dissertations

Electromigration in metal interconnects remains one of the most prominent challenges in the state-of-the-art semiconductor industry. A phenomenon defined as the momentum transfer from electrons in an electric current to the metal atoms in a conductor, electromigration creates voids and hillocks that ultimately cause failures in nanoelectronics due to short or open circuits. Additionally, electromigration induces undesirable diffusion of metal atoms into the dielectric material, forcing the need for a barrier material that can mitigate such adverse effects of the phenomenon. However, extremely tight dimensional control of modern transistor designs imposes reduced dimensions of the interconnects in order to accommodate …

Systems Approach To Producing Electrospun Polyvinylidene Difluoride Fiber Webs With Controlled Fiber Structure And Functionality, Brian D. Bell

USF Tampa Graduate Theses and Dissertations

Polyvinylidene difluoride (PVDF) is a functional polymeric material that can be used for a wide variety of applications. There are many new future applications that were recently suggested for electrospun PVDF fibers. Electrospinning is a process capable of producing nano to micro sized PVDF fibers in a web. It is important to control the structure of the web during electrospinning because by controlling the structure of the web it is possible for the PVDF fiber web to have increased performance in comparison to other common forms of PVDF.

While past scientific literature focused on applications of PVDF fibers, little was …