Nanoscience and Nanotechnology Commons^™

Observation And Control Of Photoemission And Electric Field Enhancement Of Plasmonic Antennas Through Photoemission Electron Microscopy, Christopher M. Scheffler

Dissertations and Theses

Photoemission electron microscopy (PEEM) is an imaging method which uses electrons excited through the photoelectric effect to characterize a sample surface with nanometer-level resolution. In PEEM, a high intensity laser excites electrons from the surface of the material and electron optics are used to form an image from the intensity and spatial distribution of the photoemission from the sample. The goal of this research was to study and maximize light confinement, which was accomplished using plasmonic nanostructures. Surface plasmons represent oscillations in the electron density of a material and can occur along the transition interface between a metal and a …

Simulation Of Light Propagation Captured By Photoemission Electron Microscopy (Peem), Nabila Islam

Dissertations and Theses

The Photoemission electron microscopes (PEEM) is a powerful tool capable of synchronously imaging wave nature of light manifested by interference patterns as well as its particle nature through the energy exchange between the incident photons and the photoemitted imaging electrons. PEEM offers a non-invasive high-resolution approach for studying light propagation and interaction phenomena within a nanophotonic waveguide [7,8]. The electric field intensity variation of the interference pattern yielded by the interaction between the incident light and the guided mode coupled into the waveguide produces varying photoemission yields creating contrast in PEEM image. The guided modes cannot be excited simply by …

Investigation Of The Acoustic Response Of A Confined Mesoscopic Water Film Utilizing A Combined Atomic Force Microscope And Shear Force Microscope Technique, Monte Allen Kozell

Dissertations and Theses

An atomic force microscopy beam-like cantilever is combined with an electrical tuning fork to form a shear force probe that is capable of generating an acoustic response from the mesoscopic water layer under ambient conditions while simultaneously monitoring force applied in the normal direction and the electrical response of the tuning fork shear force probe. Two shear force probes were designed and fabricated. A gallium ion beam was used to deposit carbon as a probe material. The carbon probe material was characterized using energy dispersive x-ray spectroscopy and scanning transmission electron microscopy. The probes were experimentally validated by demonstrating the …

Find, Build, And Export Information For 3d Printing Of Your Favorite Molecules And Crystal Structures At Two Dedicated Websites, Paul R. Destefano, Peter Moeck

Student Research Symposium

As 3D printers require instructions, the Nano-Crystallography Group at Portland State University is creating two websites (http://nanocrystallography.org/3dconvert/ and http://nanocrystallography.research.pdx.edu/3d-print-files/convert/) where such instructions are created, interactively, for the atomic arrangements of virtually all known molecules and crystals.

We will prepare a "pipeline" into which crystallographic information enters from two curated open access crystallographic databases, is manipulated to create the desired 3D models, and then is exported in either STL format (the standard for monochrome 3D printing) or VRML/X3D (the ISO successor to STL). The two aforementioned databases are the North-American mirror of the Crystallography Open Database (http://nanocrystallography.org) …

3d Printing Of Crystallographic Models And Open Access Databases, Werner Kaminsky, Trevor J. Snyder, Peter Moeck

Physics Faculty Publications and Presentations

Provides a brief overview of opportunities for crystallography allowed by the recent developments in 3D printing technology. in combination with open access databases.

3d Printing Of Crystallographic Models For Interdisciplinary College Education, Peter Moeck, Werner Kaminsky, Trevor J. Snyder

Physics Faculty Publications and Presentations

Provides a brief overview of the Crystallography Open Database, and how advances in 3D printing have created opportunities in teaching of college level crystallography courses.

3d Printing & Open Access Databases For Crystallographic College Education, Peter Moeck, Jennifer Stone-Sundberg, Trevor J. Snyder, Werner Kaminsky, Saulius Grazulis, International Advisory Board Of The Crystallography Open Database

Physics Faculty Publications and Presentations

Presentation gives an overview of available open access databases of crystals and crystal structures, as well as discussions of how newly developed 3D printing technologies can be used to teach crystallography at the college level. Offers advice regarding conversion of crystallographic information files to 3D printing files, and shares news from the 3D printing of crystallographic models community.

Crystallite Phase And Orientation Determinations Of (Mn, Ga) As/Gaas-Crystallites Using Analyzed (Precession) Electron Diffraction Patterns, Ines Häusler, Stavros Nicolopoulos, Edgar F. Rauch, K. Volz, Peter Moeck

Physics Faculty Publications and Presentations

Outline of the presentation:

1. Material system: (Mn,Ga)As/GaAs-crystallites

2. Structure analysis using Nano-beam Diffraction (NBD) Precession Electron Diffraction Technique (PED) --> Structure type I + II

3. Phase and orientation mapping using ASTAR

4. Conclusion

Automated Nanocrystal Orientation And Phase Mapping In The Transmission Electron Microscope On The Basis Of Precession Electron Diffraction, Edgar F. Rauch, Joaquin Portillo, Stavros Nicolopoulos, Daniel Bultreys, Sergei Rouvimov, Peter Moeck

Physics Faculty Publications and Presentations

An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope is described. It is primarily based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns. Precession electron diffraction patterns are especially useful for this purpose. The required hardware allows for a scanning-precession movement of the primary electron beam on the crystalline sample and can be interfaced to any older or newer mid-voltage transmission electron microscope (TEM). Experimentally obtained crystal phase and orientation maps are shown for a variety of samples. Comprehensive commercial and open-access crystallographic databases may be used …

Automated Crystal Phase And Orientation Mapping Of Nanocrystals In A Transmission Electron Microscope, Peter Moeck, Sergei Rouvimov, Edgar F. Rauch, Stavros Nicolopoulos

Physics Faculty Publications and Presentations

An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope (TEM) is described. It is based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns. The required hardware allows for a scanning‐precession movement of the primary electron beam on the crystalline sample and can be interfaced to any newer or older TEM. The software that goes with this hardware is flexible in its intake of raw data so that it can also create orientation and phase maps of nanocrystal from high resolution TEM (HRTEM) images. When the nanocrystals possess …

Nanometrology Device Standards For Scanning Probe Mmicroscopes And Processes For Their Fabrication And Use, Peter Moeck

Physics Faculty Publications and Presentations

Nanometrology device standards and methods for fabricating and using such devices in conjunction With scanning probe microscopes are described. The fabrication methods comprise: (1) epitaxial growth that produces nanometer sized islands of knoWn morphology, structural, morphological and chemical stability in typical nanometrology environments, and large height-to-width nano-island aspect ratios, and (2) marking suitable crystallographic directions on the device for alignment With a scanning direction.

Precession Electron Diffraction And Its Advantages For Structural Fingerprinting In The Transmission Electron Microscope, Peter Moeck, Sergei Rouvimov

Physics Faculty Publications and Presentations

The foundations of precession electron diffraction in a transmission electron microscope are outlined. A brief illustration of the fact that laboratory-based powder X-ray diffraction fingerprinting is not feasible for nanocrystals is given. A procedure for structural fingerprinting of nanocrystals on the basis of structural data that can be extracted from precession electron diffraction spot patterns is proposed.

Electron Microscopy And Optical Characterization Of Cadmium Sulphide Nanocrystals Deposited On The Patterned Surface Of Diatom Biosilica, Timothy Gutu, Debra K. Gale, Clayton Jeffryes, Wei Wang, Chih-Hung Chang, Gregory L. Rorrer, Jun Jiao

Physics Faculty Publications and Presentations

Intricately patterned biosilica obtained from the shell of unicellular algae called diatoms serve as novel templates for fabrication of optoelectronic nanostructures. In this study, the surface of diatom frustules that possessed hierarchical architecture ordered at the micro and nanoscale was coated with a nanostructured polycrystalline cadmium sulphide (CdS) thin film using a chemical bath deposition technique. The CdS thin film was composed of spherical nanoparticles with a diameter of about 75 nm. The CdS nanoparticle thin film imparted new photoluminescent properties to the intricately patterned diatom nanostructure. The imparted photoluminescent properties were dependent on the CdS coverage onto the frustules …

Structural Identification Of Cubic Iron-Oxide Nanocrystal Mixtures: X-Ray Powder Diffraction Versus Quasi-Kinematic Transmission Electron Microscopy, Peter Moeck

Physics Faculty Publications and Presentations

Two novel (and proprietary) strategies for the structural identification of a nanocrystal from either a single high-resolution (HR) transmission electron microscopy (TEM) image or a single precession electron diffraction pattern are proposed and their advantages discussed in comparison to structural fingerprinting from powder X-ray diffraction patterns. Simulations for cubic magnetite and maghemite nanocrystals are used as examples.

Three-Dimensional Structure Of Cdx (X= Se, Te) Nanocrystals By Total X-Ray Diffraction, S. K. Pradhan, Z. T. Deng, F. Tang, Y. Ren, Peter Moeck, V. Petkov

Physics Faculty Publications and Presentations

The three-dimensional structure of oleic acid-capped CdSe and thiol-capped CdTe nanocrystals used as quantum dots has been determined by total synchrotron radiationx-ray diffraction and atomic pair distribution function analysis. Both CdSe and CdTe are found to exhibit the zinc-blende-type atomic ordering. It is only slightly distorted in CdSe implying the presence of nanosize domains and very heavily distorted in CdTe due to the presence of distinct core-shell regions. The results well demonstrate the great potential of the experimental approach and thus encourage its wider application in quantum dot research.

Transmission Electron Goniometry And Its Relation To Electron Tomography For Materials Science Apoplications, Peter Moeck, P. Fraundorf

Physics Faculty Publications and Presentations

Aspects of transmission electron goniometry are discussed. Combined with high resolution phase contrast transmission electron microscopy (HRTEM) and atomic resolution scanning TEM (STEM) in the atomic number contrast (Z-STEM) or the phase contrast bright field mode, transmission electron goniometry offers the opportunity to develop dedicated methods for the crystallographic characterization of nanocrystals in three dimensions. The relationship between transmission electron goniometry and electron tomography for materials science applications is briefly discussed. Internet based java applets that facilitate the application of transmission electron goniometry for cubic crystals with calibrated tilt-rotation and double-tilt specimen holders/goniometers are mentioned. The so called cubic-minimalistic tilt …

Image-Based Nanocrystallography With Online Database Support, Peter Moeck, Ján Zahornadsky, Boris Dusek

Physics Faculty Publications and Presentations

The crystallographic phase and morphology of many materials change with the crystal size so that new needs arise to determine the crystallography of nanocrystals. Direct space high-resolution phase-contrast transmission electron microscopy (HRTEM) and atomic resolution scanning TEM (STEM) when combined with tools for image-based nanocrystallography in two (2D) and three (3D) dimensions possess the capacity to meet these needs. After a concise discussion of lattice-fringe visibility spheres and maps, this paper discusses lattice-fringe fingerprinting in 2D and tilt protocol applications. On-line database developments at Portland State University (PSU) that support image-based nanocrystallography are also mentioned.

Lattice Fringe Fingerprinting In Two Dimensions With Database Support, Peter Moeck, B. Seipel, R. Bjorge, P. Fraundorf

Physics Faculty Publications and Presentations

A brief introduction to lattice fringe fingerprinting in two dimensions (2D) with database support is given. The method is employed for the identification of the crystal phase of a small ensemble of nanocrystals. The enhanced viability of this method in aberration-corrected transmission electron microscopes (TEMs) and scanning TEMs (STEMs) is also illustrated.

Making Sense Of Nanocrystal Lattice Fringes, P. Fraundorf, Wentao Qin, Peter Moeck, Eric Mandell

Physics Faculty Publications and Presentations

The orientation dependence of thin-crystal lattice fringes can be gracefully quantified using fringe-visibility maps, a direct-space analog of Kikuchi maps [Nishikawa and Kikuchi, Nature (London) 121, 1019 (1928)]. As in navigation of reciprocal space with the aid of Kikuchi lines, fringe-visibility maps facilitate acquisition of crystallographic information from lattice images. In particular, these maps can help researchers to determine the three-dimensional lattice of individual nanocrystals, to 'fringe-fingerprint' collections of randomly oriented particles, and to measure local specimen thickness with only a modest tilt. Since the number of fringes in an image increases with maximum spatial-frequency squared, these strategies (with help …