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Characterization And Manipulation Of Double-Stranded Dna Using Atomic Force Microscopy, Lauren Skartvedt
Characterization And Manipulation Of Double-Stranded Dna Using Atomic Force Microscopy, Lauren Skartvedt
Mechanical Engineering Undergraduate Honors Theses
An atomic force microscope (AFM) is used to scan high-resolution images on the nano scale. The lambda DNA used for this project are 48,502 base pairs in length and are double-stranded. This project utilizes the NanoSurf Core AFM in order to characterize and manipulate strands of lambda DNA which have been deposited on a mica surface. The deposition process of the DNA on the mica surface was developed by the National Institute of Standards and Technology and the University of Colorado - Boulder. The AFM is used in imaging mode to scan the mica surface to locate the DNA. When …