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Doctoral Dissertations

Materials Science and Engineering

Heat transport

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Full-Text Articles in Mechanical Engineering

Thermoelectric Transport In Disordered Organic And Inorganic Semiconductors, Meenakshi Upadhyaya Jul 2021

Thermoelectric Transport In Disordered Organic And Inorganic Semiconductors, Meenakshi Upadhyaya

Doctoral Dissertations

The need for alternative energy sources has led to extensive research on optimizing the conversion efficiency of thermoelectric (TE) materials. TE efficiency is governed by figure-of-merit (ZT) and it has been an enormously challenging task to increase ZT > 1 despite decades of research due to the interdependence of material properties. Most doped inorganic semiconductors have a high electrical conductivity and moderate Seebeck coefficient, but ZT is still limited by their high lattice thermal conductivity. One approach to address this problem is to decrease thermal conductivity by means of alloying and nanostructuring, another is to consider materials with an inherently low …


A Fe-Fd Hybrid Scheme For Solving Parabolic Two-Step Micro Heat Transport Equations In Irregularly Shaped Three Dimensional Double -Layered Thin Films Exposed To Ultrashort -Pulse Lasers, Brian R. Barron Oct 2005

A Fe-Fd Hybrid Scheme For Solving Parabolic Two-Step Micro Heat Transport Equations In Irregularly Shaped Three Dimensional Double -Layered Thin Films Exposed To Ultrashort -Pulse Lasers, Brian R. Barron

Doctoral Dissertations

Multi-layer thin films are important components in many micro-electronic devices. These films are often used when a single film layer is insufficient to meet devices specifications. The continued reduction in component size has the side effect of increasing the thermal stress on these films and consequently the devices they comprise. Understanding the transfer of heat-energy at the micro-scale is important for thermal processing using a pulse-laser. Often, micro-voids may be found in processed devices. This is due to thermal expansion. Such defects may cause an amplification of neighboring defects resulting in severe damage and consequently the failure of the device. …