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Articles 1 - 3 of 3
Full-Text Articles in Mechanical Engineering
Structural Investigations On Nanocrystalline Ni-W Alloy Films By Transmission Electron Microscopy
Structural Investigations On Nanocrystalline Ni-W Alloy Films By Transmission Electron Microscopy
A.S. Md Abdul Haseeb
Electrodeposited Ni-W alloys have been investigated in the as-deposited state by transmission electron microscopy in order to investigate the microstructural features in dependence of the tungsten content. Within the tungsten content range from 7 at.% up to 12 at.%, the microstructure is nanocrystalline characterized by a bimodal grain size distribution, consisting out of 20 to 200 nm sized grains and also larger grains with several 100 nm characteristic dimension. No clear trend in microstructure formation is visible with W content or deposition conditions in the investigated W content range. Only solid solution phase characteristics were observed. The lattice constant is …
Spreading Profile Of Dopant Solution On Pre-Sintered Silica Layers For Selective Area Doping Of Integrated Optic Planar Glass Samples
A.S. Md Abdul Haseeb
The spread profile of potassium-permanganate (KMnO4) dye on a porous pre-sintered silica layer deposited via Flame Hydrolysis Deposition is presented. The work is aimed at controlling the dopant profile on the resulting glass layer for optically passive and active devices integration. KMnO4 is used as it allows visual qualification of its spread on the soot layer. Pre-sintered silica layers allow for application of dopants into the glass matrix via adsorption and pore retention. Selective area doping is achieved by applying specific volumes of the dye onto pre-selected areas on the sample using a micropipette. Higher dye volumes applied would result …
Effects Of Annealing Treatment On Optical Properties Of Anatase Tio 2 Thin Films
Effects Of Annealing Treatment On Optical Properties Of Anatase Tio 2 Thin Films
A.S. Md Abdul Haseeb
In this investigation, anatase TiO 2 thin films were grown by radio frequency magnetron sputtering on glass substrates at a high sputtering pressure and room temperature. The anatase films were then annealed at 300-600 °C in air for a period of 1 hour. To examine the structure and morphology of the films, X-ray diffraction (XRD) and atomic force microscopy (AFM) methods were used respectively. From X-ray diffraction patterns of the TiO 2 films, it was found that the as-deposited film showed some differences compared with the annealed films and the intensities of the peaks of the crystalline phase increased with …