Mechanical Engineering Commons^™

Control Of Single- And Dual-Probe Atomic Force Microscopy, Muthukumaran Loganathan

Doctoral Dissertations

“Atomic force microscope (AFM) is one of the important and versatile tools available in the field of nanotechnology. It is a type of probe-based microscopy wherein an atomically sharp tip, mounted on the free end of a microcantilever, probes the surface of interest to generate 3D topographical images with nanoscale resolution. An integral part of the AFM is the feedback controller that regulates the probe deflection in the presence of surface height changes, enabling the control action to be used for generating topographical image of the sample. Besides sensing, the probe can also be used as a mechanical actuator to …