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Full-Text Articles in Mechanical Engineering
Computer Aided Contour Profiling Of High Strength Deposits, Sriram Praneeth Isanaka, Amar Bala Sridhar, Frank W. Liou, Joseph William Newkirk
Computer Aided Contour Profiling Of High Strength Deposits, Sriram Praneeth Isanaka, Amar Bala Sridhar, Frank W. Liou, Joseph William Newkirk
Mechanical and Aerospace Engineering Faculty Research & Creative Works
Additive manufacturing processes suffer from the effect of ripples, edge rounding and surface variations. To reduce their effect, ideal process parameters for the laser deposition process were investigated. Also, a new method was identified to analyze deposits by accurately plotting their contours. This was achieved through point cloud data of the deposits generated using coordinate measurement and 3D scanning. Curve fitting was performed on the data in Matlab to generate the contours of the deposit. The intercept values, heights, and contact angle of the curves give an indication of the uniformity of deposits and aid in reducing defects.
Characterization And Modeling Of Local Electromechanical Response In Stress-Biased Piezoelectric Actuators, N. Navapan-Traiphol, Robert W. Schwartz, Daniel S. Stutts, J. Wood
Characterization And Modeling Of Local Electromechanical Response In Stress-Biased Piezoelectric Actuators, N. Navapan-Traiphol, Robert W. Schwartz, Daniel S. Stutts, J. Wood
Mechanical and Aerospace Engineering Faculty Research & Creative Works
Numerous investigators have explored the factors that contribute to the high electromechanical performance of stress-biased actuators with particular attention being given to the importance of the extrinsic (domain wall translation) response mechanism. Based on the variation in lateral stress through the thickness of the piezoelectric layer within these devices, it has been suggested that the piezoelectric coefficient varies as a function of position within the layer, though no direct evidence has been previously presented. In this study, the results of Moire interferometry investigations of local strains within these devices are reviewed. The technique permits effective depth-profiling of local deformations at …