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Simulated Effects Of Measurement Noise On Contact Measurements Between Rough And Smooth Surfaces, Caprice Gray, Robert White, Vincent Manno, Chris Rogers
Simulated Effects Of Measurement Noise On Contact Measurements Between Rough And Smooth Surfaces, Caprice Gray, Robert White, Vincent Manno, Chris Rogers
Vincent P. Manno
To test the accuracy of optically measuring contact, we examined the height distribution histogram of a simulated rough surface contacting a smooth surface. We qualified the technique sensitivity as a function of the inverse signal-to-noise ratio having values ranging from 0 to 0.3. An explanation of how the analysis technique can be applied to Dual Emission Laser-Induced Fluorescence (DELIF) measurements is provided.