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Full-Text Articles in Materials Science and Engineering
Generalized Ellipsometry In-Situ Quantification Of Organic Adsorbate Attachment Within Slanted Columnar Thin Films, Keith B. Rodenhausen Jr., Daniel Schmidt, Tadas Kasputis, Angela K. Pannier, Eva Schubert, Mathias Schubert
Generalized Ellipsometry In-Situ Quantification Of Organic Adsorbate Attachment Within Slanted Columnar Thin Films, Keith B. Rodenhausen Jr., Daniel Schmidt, Tadas Kasputis, Angela K. Pannier, Eva Schubert, Mathias Schubert
Department of Chemical and Biomolecular Engineering: Faculty Publications
We apply generalized ellipsometry, well-known to be sensitive to the optical properties of anisotropic materials, to determine the amount of fibronectin protein that adsorbs onto a Ti slanted columnar thin film from solution. We find that the anisotropic optical properties of the thin film change upon organic adsorption. An optical model for ellipsometry data analysis incorporates an anisotropic Bruggeman effective medium approximation. We find that differences in experimental data from before and after fibronectin adsorption can be solely attributable to the uptake of fibronectin within the slanted columnar thin film. Simultaneous, in-situ generalized ellipsometry and quartz crystal microbalance measurements show …
In-Situ Ellipsometry Characterization Of Anodically Grown Silicon Dioxide And Lithium Intercalation Into Silicon, Eric A. Montgomery
In-Situ Ellipsometry Characterization Of Anodically Grown Silicon Dioxide And Lithium Intercalation Into Silicon, Eric A. Montgomery
Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research
In this thesis, in-situ ellipsometry and electroanalytical investigations of two electrochemical processes are reported: including the formation of anodically grown silicon dioxide and the intercalation of lithium into silicon. Analysis of the ellipsometry data shows that the anodically grown silicon dioxide layer is uniform and has similar properties as thermally grown silicon dioxide. The lithium-ion intercalation data reveals non-uniform thin film formation, which requires further studies and development of appropriate ellipsometric optical models.
Advisers: Eva Schubert and Mathias Schubert