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Full-Text Articles in Engineering Science and Materials
Experimental Verification Of Transparent Spin Mode In Rhic, V. S. Morozov, P. Adams, Y. S. Derbenev, Y. Filatov, H. Huang, A. M. Kondratenko, M. A. Kondratenko, F. Lin, F. Méot, V. Ptitsyn, W. B. Schmidke, Y. Zhang
Experimental Verification Of Transparent Spin Mode In Rhic, V. S. Morozov, P. Adams, Y. S. Derbenev, Y. Filatov, H. Huang, A. M. Kondratenko, M. A. Kondratenko, F. Lin, F. Méot, V. Ptitsyn, W. B. Schmidke, Y. Zhang
Engineering Technology Faculty Publications
High electron and ion polarizations are some of the key design requirements of a future Electron Ion Collider (EIC). The transparent spin mode, a concept inspired by the figure 8 ring design of JLEIC, is a novel technique for preservation and control of electron and ion spin polarizations in a collider or storage ring. It makes the ring lattice "invisible" to the spin and allows for polarization control by small quasi-static magnetic fields with practically no effect on the beam’s orbital characteristics. It offers unique opportunities for polarization maintenance and control in Jefferson Lab’s JLEIC and in BNL’s eRHIC. The …
Magnetron Sputtering Of Nb3Sn For Srf Cavities, Md. N. Sayeed, H. Elsayed-Ali, G. V. Eremeev, M. J. Kelley, U. Pudasaini, C. E. Reece
Magnetron Sputtering Of Nb3Sn For Srf Cavities, Md. N. Sayeed, H. Elsayed-Ali, G. V. Eremeev, M. J. Kelley, U. Pudasaini, C. E. Reece
Electrical & Computer Engineering Faculty Publications
Nb3Sn is a potential candidate for surface material of SRF cavities since it can enable the cavity to operate at higher temperatures with high quality factor and at an increased accelerating gradient. Nb-Sn films were deposited using magnetron sputtering of individual Nb and Sn targets onto Nb and sapphire substrates. The as-deposited films were annealed at 1200 °C for 3 hours. The films were characterized for their structure by X-ray Diffraction (XRD), morphology by Field Emission Scanning Electron Microscopy (FESEM), and composition by Energy Dispersive X-ray Spectroscopy (EDS) and Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS). The …