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Electrical and Computer Engineering
Department of Electrical and Computer Engineering: Faculty Publications
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Full-Text Articles in Engineering Science and Materials
Tunable Plasmonic Resonances In Highly Porous Nano-Bamboo Si-Au Superlattice-Type Thin Films, Ufuk Kılıç, Alyssa Mock, René Feder, Derek Sekora, Matthew J. Hilfiker, Rafal Korlacki, Eva Schubert, Christos Argyropoulos, Mathias Schubert
Tunable Plasmonic Resonances In Highly Porous Nano-Bamboo Si-Au Superlattice-Type Thin Films, Ufuk Kılıç, Alyssa Mock, René Feder, Derek Sekora, Matthew J. Hilfiker, Rafal Korlacki, Eva Schubert, Christos Argyropoulos, Mathias Schubert
Department of Electrical and Computer Engineering: Faculty Publications
We report on fabrication of spatially-coherent columnar plasmonic nanostructure superlattice-type thin films with high porosity and strong optical anisotropy using glancing angle deposition. Subsequent and repeated depositions of silicon and gold lead to nanometer-dimension subcolumns with controlled lengths. The superlattice-type columns resemble bamboo structures where smaller column sections of gold form junctions sandwiched between larger silicon column sections (“nano-bamboo”). We perform generalized spectroscopic ellipsometry measurements and finite element method computations to elucidate the strongly anisotropic optical properties of the highly-porous nano-bamboo structures. The occurrence of a strongly localized plasmonic mode with displacement pattern reminiscent of a dark quadrupole mode is …
Critical-Point Model Dielectric Function Analysis Of Wo3 Thin Films Deposited By Atomic Layer Deposition Techniques, Ufuk Kılıç, Derek Sekora, Alyssa Mock, Rafał Korlacki, Elena M. Echeverría, Natale J. Ianno, Eva Schubert, Mathias Schubert
Critical-Point Model Dielectric Function Analysis Of Wo3 Thin Films Deposited By Atomic Layer Deposition Techniques, Ufuk Kılıç, Derek Sekora, Alyssa Mock, Rafał Korlacki, Elena M. Echeverría, Natale J. Ianno, Eva Schubert, Mathias Schubert
Department of Electrical and Computer Engineering: Faculty Publications
WO3 thin films were grown by atomic layer deposition and spectroscopic ellipsometry data gathered in the photon energy range of 0.72-8.5 eV and from multiple samples was utilized to determine the frequency dependent complex-valued isotropic dielectric function for WO3. We employ a critical-point model dielectric function analysis and determine a parameterized set of oscillators and compare the observed critical-point contributions with the vertical transition energy distribution found within the band structure of WO3 calculated by density functional theory. We investigate surface roughness with atomic force microscopy and compare to ellipsometric determined effective roughness layer thickness.