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Full-Text Articles in Electrical and Computer Engineering
Trends In Uspto Office Actions, Ron D. Katznelson
Trends In Uspto Office Actions, Ron D. Katznelson
Ron D. Katznelson
No abstract provided.
Markov Chain Monte Carlo Defect Identification In Nde Images, Aleksandar Dogandžić, Benhong Zhang
Markov Chain Monte Carlo Defect Identification In Nde Images, Aleksandar Dogandžić, Benhong Zhang
Aleksandar Dogandžić
We derive a hierarchical Bayesian method for identifying elliptically‐shaped regions with elevated signal levels in NDE images. We adopt a simple elliptical parametric model for the shape of the defect region and assume that the defect signals within this region are random following a truncated Gaussian distribution. Our truncated‐Gaussian model ensures that the signals within the defect region are higher than the baseline level corresponding to the noise‐only case. We derive a closed‐form expression for the kernel of the posterior probability distribution of the location, shape, and defect‐signal distribution parameters (model parameters). This result is then used to develop Markov …