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Full-Text Articles in Electrical and Computer Engineering
Schlieren Photography Of Current Filaments In Surface-Related Breakdown Of Silicon, B. J. Hankla, P. F. Williams
Schlieren Photography Of Current Filaments In Surface-Related Breakdown Of Silicon, B. J. Hankla, P. F. Williams
P. F. (Paul Frazer) Williams Publications
We have used a modified Schlieren technique to photograph current filaments formed inside silicon during the very early stages of surface-related breakdown. We believe that the features we see are due to heating in the filamentary channel. The very rapid formation of these channels suggests that they result from streamer-like phenomena in the bulk silicon.
High-Temporal-Resolution, High-Sensitivity Imaging Of Streamers In A Long Atmospheric Pressure Gap, W. J. Yi, B. J. Hankla, P. F. Williams
High-Temporal-Resolution, High-Sensitivity Imaging Of Streamers In A Long Atmospheric Pressure Gap, W. J. Yi, B. J. Hankla, P. F. Williams
P. F. (Paul Frazer) Williams Publications
We present time-resolved shutter photographs of streamers in a 13-cm gas-filled atmospheric pressure gap. The photographs show that in pure N2, the streamers split readily in two. In mixtures containing O2 , on the other hand, this bifurcation is substantially reduced.