Open Access. Powered by Scholars. Published by Universities.®
Electrical and Computer Engineering Commons™
Open Access. Powered by Scholars. Published by Universities.®
- Discipline
- Keyword
-
- Electrical and Computer engineering (2)
- AWGN (1)
- AWGN channels (1)
- Annealing (1)
- Carbides (1)
-
- Convolutional codes (1)
- Costs (1)
- Decoding (1)
- Delay effects (1)
- Design optimization (1)
- Detectors (1)
- Dispersion (1)
- Fading (1)
- Field effect transistors (1)
- Maximum likelihood detection (1)
- Maximum likelihood estimation (1)
- P-n junctions (1)
- Performance analysis (1)
- Phase detection (1)
- Phase shift keying (1)
- Robustness (1)
- State estimation (1)
- Time-varying channels (1)
- USA Councils (1)
- Viterbi algorithm (1)
Articles 1 - 3 of 3
Full-Text Articles in Electrical and Computer Engineering
Detection For A Statistically-Known, Time-Varying Dispersive Channel, David W. Matolak, S. G. Wilson
Detection For A Statistically-Known, Time-Varying Dispersive Channel, David W. Matolak, S. G. Wilson
Faculty Publications
Detection for the statistically known channel (SKC) is aimed at obtaining good performance in situations where our statistical knowledge of a time-varying channel is good, and where other equalization/detection schemes are either too complex to implement, or their performance is limited due to the rapidity of channel fading, or where we are simply unable to perform channel estimation. By using a statistical characterization of the channel, we develop a new detector that performs maximum-likelihood sequence estimation (MLSE) (given the channel model) on blocks of N symbols. Both symbol-spaced and fractionally spaced samples are used, to obtain two different detectors, that …
Low-Frequency Noise In 4h-Silicon Carbide Junction Field Effect Transistors, J. W. Palmour, M. E. Levinshtein, S. L. Rumyantsev, Grigory Simin
Low-Frequency Noise In 4h-Silicon Carbide Junction Field Effect Transistors, J. W. Palmour, M. E. Levinshtein, S. L. Rumyantsev, Grigory Simin
Faculty Publications
Low frequency noise in 4H‐silicon carbide junction field effect transistors (JFETs) has been investigated. JFETs with a buried p + n junction gate were manufactured by CREE Research Inc. Very low noise level has been observed in the JFETs. At 300 K the value of Hooge constant α is as small as α∼10−5 and the α value can be decreased by an appropriate annealing to α∼2×10−6. It has been shown that even these extremely low noise values are determined not by the volume noise sources but by the noise at the SiC–SiO2 interface.
Variable-Complexity Trellis Decoding Of Binary Convolutional Codes, David W. Matolak, S. G. Wilson
Variable-Complexity Trellis Decoding Of Binary Convolutional Codes, David W. Matolak, S. G. Wilson
Faculty Publications
Considers trellis decoding of convolutional codes with selectable effort, as measured by decoder complexity. Decoding is described for single parent codes with a variety of complexities, with performance "near" that of the optimal fixed receiver complexity coding system. Effective free distance is examined. Criteria are proposed for ranking parent codes, and some codes found to be best according to the criteria are tabulated, Several codes with effective free distance better than the best code of comparable complexity were found. Asymptotic (high SNR) performance analysis and error propagation are discussed. Simulation results are also provided.