Electrical and Computer Engineering Commons^™

Exploitation Of Unintentional Information Leakage From Integrated Circuits, William E. Cobb

Theses and Dissertations

Unintentional electromagnetic emissions are used to recognize or verify the identity of a unique integrated circuit (IC) based on fabrication process-induced variations in a manner analogous to biometric human identification. The effectiveness of the technique is demonstrated through an extensive empirical study, with results presented indicating correct device identification success rates of greater than 99:5%, and average verification equal error rates (EERs) of less than 0:05% for 40 near-identical devices. The proposed approach is suitable for security applications involving commodity commercial ICs, with substantial cost and scalability advantages over existing approaches. A systematic leakage mapping methodology is also proposed to …