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Detection Of Variable Retention Time In Dram, Neraj Kumar
Detection Of Variable Retention Time In Dram, Neraj Kumar
Dissertations and Theses
This thesis investigates a test method to detect the presence of Variable Retention Time (VRT) bits in manufactured DRAM. The VRT bits retention time is modeled as a 2-state random telegraph process that includes miscorrelation between test and use. The VRT defect is particularly sensitive to test and use conditions. A new test method is proposed to screen the VRT bits by simulating the use conditions during manufacturing test. Evaluation of the proposed test method required a bit-level VRT model to be parameterized as a function of temperature and voltage conditions. The complete 2-state VRT bit model combines models for …