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University of Nebraska - Lincoln
Polarimetric; scatterometer; Mueller matrix; cross sections; ellipsometry; optical activity.
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Full-Text Articles in Computer Engineering
Description Of Versatile Optical Polarimetric Scatterometer That Measures All 16 Elements Of The Mueller Matrix For Reflection And Transmission: Application To Measurements Of Scatter Cross Sections, Ellipsometric Parameters, Optical Activity, And The Complex Chiral Parameters, Ezekiel Bahar, Robert D. Kubik
Description Of Versatile Optical Polarimetric Scatterometer That Measures All 16 Elements Of The Mueller Matrix For Reflection And Transmission: Application To Measurements Of Scatter Cross Sections, Ellipsometric Parameters, Optical Activity, And The Complex Chiral Parameters, Ezekiel Bahar, Robert D. Kubik
Department of Electrical and Computer Engineering: Faculty Publications
A detailed description of an optical polarimetric scatterometer, its capabilities, and special application are presented. This instrument measures the 44 Mueller matrix elements as well as bidirectional reflective distribution functions scatter cross sectionsfor light that is scattered from a target. Incident polarized light at wavelengths =0.6328 and =1.06 m can be directed toward the target in an arbitrary direction. The receiver can be located anywhere in the solid angle 4. Backscatter measurements, most commonly used in remote sensing, can also be obtained. The scatterometer has been used to validate different analytical/numerical solutions to a broad class of electromagnetic scattering problems, …