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Transmission Electron Microscopy Characterization Of High-Temperatur Oxidation Of Fe-20cr-5al Alloy Prepared By Focused Ion Beam Technique, Mohammad Dani, Pudji Untoro, Teguh Yulius Surya Panca Putra, Parikin Parikin, Joachim Mayer, Arbi Dimyati
Transmission Electron Microscopy Characterization Of High-Temperatur Oxidation Of Fe-20cr-5al Alloy Prepared By Focused Ion Beam Technique, Mohammad Dani, Pudji Untoro, Teguh Yulius Surya Panca Putra, Parikin Parikin, Joachim Mayer, Arbi Dimyati
Makara Journal of Technology
The Focused Ion Beam (FIB) technique was applied for cross section preparation of the oxidized alloy for Transmission Electron Microscopy (TEM) study. Prior to preparation, the specimens of Fe-20Cr-5Al alloy sheet were oxidized in air at 1200 oC for 2 minutes, 10 minutes, 2 hours, and 100 hours. The microstructure and elemental composition of the samples were characterized using TEM equipped with an Energy Dispersive X-Ray Spectroscopy (EDX). The Electron Energy Loss Spectroscopy (EELS) was used to determine of the light elements. The TEM investigation reveals remarkable microstructure evolution of the specimens during oxidation which generally exhibit a typical multi-layer …