Computer Engineering Commons^™

Modeling And Architectural Simulations Of The Statistical Static Timing Analysis Of The Variation Sources For Vlsi Circuits, Abu M. Baker

College of Engineering: Graduate Celebration Programs

As CMOS technology scales down, process variation introduces significant uncertainty in power and performance to VLSI circuits and significantly affects their reliability. Although Static-Timing Analysis (STA) remains an excellent tool, current trends in process scaling have imposed significant difficulties to STA. As one of the promising solutions, Statistical static timing analysis (SSTA) has become the frontier research topic in recent years in combating such variation effects. This poster will be focusing on two aspects of SSTA and its applications in VLSI designs: (1) Statistical timing modeling and analysis; and (2) Architectural implementations of the atomic operations (max and add) using …