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Full-Text Articles in Computer Engineering
System For Sequentially Providing Aberation Corrected Electromagnetic Radation To A Spot On A Sample At Multiple Angles Of Incidence, Martin M. Liphardt, John A. Woollam,
System For Sequentially Providing Aberation Corrected Electromagnetic Radation To A Spot On A Sample At Multiple Angles Of Incidence, Martin M. Liphardt, John A. Woollam,
Department of Electrical and Computer Engineering: Faculty Publications
A system for sequentially providing electromagnetic radia tion to a spot on a sample at different angles of incidence, and after reflection therefrom into a detector. The system includes a plurality of spherical mirrors, and a refractive element for correcting aberration.
Rotating Or Rotatable Compensator Systemi Providing Aberation Corrected Electromagnetic Raadation To A Spot On A Sample At Multiple Angles Of Ancidence, Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, John A. Woollam
Rotating Or Rotatable Compensator Systemi Providing Aberation Corrected Electromagnetic Raadation To A Spot On A Sample At Multiple Angles Of Ancidence, Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, John A. Woollam
Department of Electrical and Computer Engineering: Faculty Publications
The present invention relates to ellipsometer systems, and more particularly to ellipsometer systems comprising trans missive rotating or stepwise rotatable compensators for continuously or step-wise varying polarization states and further comprising transmissive multi-element lens focusing of a spectroscopic electromagnetic beam into a small, chromatically relatively undispersed area spot on a sample system. The ellipsometer system optionally is present in an environmental control chamber.
Application Of Intermediate Wavelength Band Spectroscopic Ellipsometry To In-Stu. Real Time Fabrication Of Multiple Layer Alternating Hghalow Refractive Index Filters, Blaine D. Johs, Jeffery S. Hale, John A. Woollam, Craig M. Herzinger
Application Of Intermediate Wavelength Band Spectroscopic Ellipsometry To In-Stu. Real Time Fabrication Of Multiple Layer Alternating Hghalow Refractive Index Filters, Blaine D. Johs, Jeffery S. Hale, John A. Woollam, Craig M. Herzinger
Department of Electrical and Computer Engineering: Faculty Publications
Disclosed is application of oblique angle of incidence, reflection and/or transmission mode spectroscopic ellipsometry PSI and/or DELTA, (including combinations thereof and/or mathematical equivalents), vs. wavelength data over an intermediate wavelength band range around a pass or reject band, to monitor and/or control fabrication of multiple layer high/low refractive index band-pass, band-reject and varied attenuation vs. wavelength thin film interference filters, either alone or in combination with transmissive non-ellipsometric electromagnetic beam turning point vs. layer data obtained at an essentially normal angle of incidence.
A Theoretical Framework For Quality-Aware Cross-Layer Optimized Wireless Multimedia Communications, Song Chi, Haohong Wang, Dalei Wu
A Theoretical Framework For Quality-Aware Cross-Layer Optimized Wireless Multimedia Communications, Song Chi, Haohong Wang, Dalei Wu
Department of Electrical and Computer Engineering: Faculty Publications
Although cross-layer has been thought as one of themost effective and efficient ways formultimedia communications over wireless networks and a plethora of research has been done in this area, there is still lacking of a rigorous mathematical model to gain indepth understanding of cross-layer design tradeoffs, spanning from application layer to physical layer. As a result, many existing cross-layer designs enhance the performance of certain layers at the price of either introducing side effects to the overall system performance or violating the syntax and semantics of the layered network architecture. Therefore, lacking of a rigorous theoretical study makes existing cross-layer …
Use Of Ellipsometry And Surface Plasmon Resonance In Monitoring Thin Film Deposition Or Removal From A Substrate Surface, John A. Woollam, Blaine D. Johs, Thomas E. Tiwald, Martin M. Liphardt, James D. Welch
Use Of Ellipsometry And Surface Plasmon Resonance In Monitoring Thin Film Deposition Or Removal From A Substrate Surface, John A. Woollam, Blaine D. Johs, Thomas E. Tiwald, Martin M. Liphardt, James D. Welch
Department of Electrical and Computer Engineering: Faculty Publications
Improved methodology for monitoring deposition or removal of material to or from a process and/or Wittness substrate Which demonstrates a negative e1 at some Wave length. The method involves detection of changes in P-polarized electromagnetism ellipsometric DELTA at SPR Resonance Angle-of-lncidence (A01) to monitor deposition of and/or removal of minute amounts of materials onto, or from, said process and/or Witness substrate. The methodology can optionally monitor ellipsometric PS1, and involves simultaneously or sequentially applying non-P-polarized electromagnetism at the same angle of incidence, or electromagnetic radiation of any polarization at a different angle-of-incidence and Wavelength to the process or Witt ness …
Flying Mobile On-Board Ellipsometer, Polarimeter, Reflectometer And The Like Systems, Blaine D. Johs,, Ping He, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam, James D. Welch
Flying Mobile On-Board Ellipsometer, Polarimeter, Reflectometer And The Like Systems, Blaine D. Johs,, Ping He, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam, James D. Welch
Department of Electrical and Computer Engineering: Faculty Publications
A substantially self-contained “on-boar ” material system investigation system functionally mounted on a three dimen sional locational system to enable positioning at desired locations on, and distances from, the surface of a large sample, including the capability to easily and conveniently change the angle-of-incidence of a beam of electromagnetic radiation onto a sample surface.
Sample Entry Purge System In Spectrophotometer, Ellipsometer, Polarimeter And The Like Systems, Steven E. Green, Ping He, Galen L. Pfeiffer, Brian D. Guenther, Gerald T. Cooney, John A. Woollam, Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger
Sample Entry Purge System In Spectrophotometer, Ellipsometer, Polarimeter And The Like Systems, Steven E. Green, Ping He, Galen L. Pfeiffer, Brian D. Guenther, Gerald T. Cooney, John A. Woollam, Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger
Department of Electrical and Computer Engineering: Faculty Publications
A sample sequestering system which allows access to a subspace in a chamber encompassed generally enclosed space, for use in entering and removing a sample when the subspace is opened to atmosphere. Sufficient purge gas is flowed from withing the generally enclosed space into the subspace discourage atmospheric contaminates from entering into the space is a spectrophotometer, ellipsometer or polarimeter or the like system which operates at wavelengths, (eg. UV), which are advesely affected, (eg. absorded), by typical atmospheric contents.
System For And Method Of Investigating The Exact Same Point On A Sample Substrate With Multiple Wavelengths, Galen L. Pfeiffer, Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Christopher A. Goeden, Ping He, John A. Woollam, James D. Welch
System For And Method Of Investigating The Exact Same Point On A Sample Substrate With Multiple Wavelengths, Galen L. Pfeiffer, Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Christopher A. Goeden, Ping He, John A. Woollam, James D. Welch
Department of Electrical and Computer Engineering: Faculty Publications
Disclosed are system for and method of analyzing a sample at substantially the exact same small spot point on a sample with a plurality of wavelengths.
System For And Method Of Investigating The Exact Same Point On A Sample Substrate With Multiple Wavelengths, Galen L. Pfeiffer, Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Christopher A. Goeden, Ping He, John A. Woollam, James D. Welch
System For And Method Of Investigating The Exact Same Point On A Sample Substrate With Multiple Wavelengths, Galen L. Pfeiffer, Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Christopher A. Goeden, Ping He, John A. Woollam, James D. Welch
Department of Electrical and Computer Engineering: Faculty Publications
Disclosed are system for and method of analyzing a sample at Substantially the exact same Small spot point on a sample with a plurality of wavelengths.
C-Fos As A Proapoptotic Agent In Trail-Induced Apoptosis In Prostate Cancer Cells, Xiaoping Zhang, Liang Zhang, Hongmei Yang, Xu Huang, Hasan H. Otu, Towia A. Libermann, William C. Dewolf, Roya Khosravi-Far, Aria F. Olumi
C-Fos As A Proapoptotic Agent In Trail-Induced Apoptosis In Prostate Cancer Cells, Xiaoping Zhang, Liang Zhang, Hongmei Yang, Xu Huang, Hasan H. Otu, Towia A. Libermann, William C. Dewolf, Roya Khosravi-Far, Aria F. Olumi
Department of Electrical and Computer Engineering: Faculty Publications
Tumor necrosis factor–related apoptosis-inducing ligand (TRAIL)/Apo-2L promotes apoptosis in cancer cells while sparing normal cells. Although many cancers are sensitive to TRAIL-induced apoptosis, some evade the proapoptotic effects of TRAIL. Therefore, differentiating molecular mechanisms that distinguish between TRAIL-sensitive and TRAIL-resistant tumors are essential for effective cancer therapies. Here, we show that c-Fos functions as a proapoptotic agent by repressing the antiapoptotic molecule c-FLIP(L). c-Fos binds the c-FLIP(L) promoter, represses its transcriptional activity, and reduces c-FLIP(L) mRNA and protein levels. Therefore, c-Fos is a key regulator of c-FLIP(L), and activation of c-Fos determines whether a cancer cell will undergo cell death …
United States Patent Application Publication: System And Method For Sequence Distance Measure For Phylogenetic Tree Construction, K. Sayood, Hasan H. Otu, Steven H. Hinrichs
United States Patent Application Publication: System And Method For Sequence Distance Measure For Phylogenetic Tree Construction, K. Sayood, Hasan H. Otu, Steven H. Hinrichs
Department of Electrical and Computer Engineering: Faculty Publications
The present invention permits identification of biological materials following recovery of DNA using standard techniques by comparing a mathematical characterization of the unknown sequence with the mathematical characterization of DNA sequences of known genera and species. The clinical identification of infectious organisms is required for accurate diagnosis and selection of antimicrobial therapeutics. The invention allows an ab initio approach with the potential for rapid identification of biological materials of unknown origin. The approach provides for identification and classification of emergent or new organisms without previous phenotypic identification. The technique may also be used in monitoring situations where the need exists …
Serum Proteome Profiling Detects Myelodysplastic Syndromes And Identifies Cxc Chemokine Ligands 4 And 7 As Markers For Advanced Disease, Manuel Aivado, Dimitrios Spentzos, Ulrich Germing, Gil Alterovitz, Xiao-Ying Meng, Franck Grall, Aristoteles A. N. Giagounidis, Giannoula Klement, Ulrich Steidl, Hasan H. Otu, Akos Czibere, Wolf C. Prall, Christof Iking-Konert, Michelle Shayne, Marco F. Ramoni, Norbert Gattermann, Rainer Haas, Constantine S. Mitsiades, Eric T. Fung, Towia A. Libermann
Serum Proteome Profiling Detects Myelodysplastic Syndromes And Identifies Cxc Chemokine Ligands 4 And 7 As Markers For Advanced Disease, Manuel Aivado, Dimitrios Spentzos, Ulrich Germing, Gil Alterovitz, Xiao-Ying Meng, Franck Grall, Aristoteles A. N. Giagounidis, Giannoula Klement, Ulrich Steidl, Hasan H. Otu, Akos Czibere, Wolf C. Prall, Christof Iking-Konert, Michelle Shayne, Marco F. Ramoni, Norbert Gattermann, Rainer Haas, Constantine S. Mitsiades, Eric T. Fung, Towia A. Libermann
Department of Electrical and Computer Engineering: Faculty Publications
Myelodysplastic syndromes (MDS) are among the most frequent hematologic malignancies. Patients have a short survival and often progress to acute myeloid leukemia. The diagnosis of MDS can be difficult; there is a paucity of molecular markers, and the pathophysiology is largely unknown. Therefore, we conducted a multicenter study investigating whether serum proteome profiling may serve as a noninvasive platform to discover novel molecular markers for MDS. We generated serum proteome profiles from 218 individuals by MS and identified a profile that distinguishes MDS from non-MDS cytopenias in a learning sample set. This profile was validated by testing its ability to …