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Digital Circuits

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Graduate Theses and Dissertations

Theses/Dissertations

2014

Asynchronous

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Full-Text Articles in Computer Engineering

Technology Mapping, Design For Testability, And Circuit Optimizations For Null Convention Logic Based Architectures, Farhad Alibeygi Parsan Dec 2014

Technology Mapping, Design For Testability, And Circuit Optimizations For Null Convention Logic Based Architectures, Farhad Alibeygi Parsan

Graduate Theses and Dissertations

Delay-insensitive asynchronous circuits have been the target of a renewed research effort because of the advantages they offer over traditional synchronous circuits. Minimal timing analysis, inherent robustness against power-supply, temperature, and process variations, reduced energy consumption, less noise and EMI emission, and easy design reuse are some of the benefits of these circuits. NULL Convention Logic (NCL) is one of the mainstream asynchronous logic design paradigms that has been shown to be a promising method for designing delay-insensitive asynchronous circuits.

This dissertation investigates new areas in NCL design and test and is made of three sections. The first section discusses …


Radiation-Hardened Delay-Insensitive Asynchronous Circuits For Multi-Bit Seu Mitigation And Data-Retaining Sel Protection, John Davis Brady May 2014

Radiation-Hardened Delay-Insensitive Asynchronous Circuits For Multi-Bit Seu Mitigation And Data-Retaining Sel Protection, John Davis Brady

Graduate Theses and Dissertations

Radiation can have highly damaging effects on circuitry, especially for space applications, if designed without radiation-hardening mechanisms. Delay-insensitive asynchronous circuits inherently have promising potentials in mitigating the effects of radiation due to their delay insensitivity. This thesis proposes the use of two delay-insensitive asynchronous logic architectures to mitigate the effects of up to two single-event upsets (SEU) and a single-event latch-up (SEL). The multi-bit SEU mitigation with SEL protection architecture improves the original design by providing more integrity against data corruption and lock-ups caused by multi-bit SEUs, and it is expanded to simultaneously provide protection against SEL. The multi-bit SEU …