Aerospace Engineering Commons^™

Characterization And Modeling Of Local Electromechanical Response In Stress-Biased Piezoelectric Actuators, N. Navapan-Traiphol, Robert W. Schwartz, Daniel S. Stutts, J. Wood

Mechanical and Aerospace Engineering Faculty Research & Creative Works

Numerous investigators have explored the factors that contribute to the high electromechanical performance of stress-biased actuators with particular attention being given to the importance of the extrinsic (domain wall translation) response mechanism. Based on the variation in lateral stress through the thickness of the piezoelectric layer within these devices, it has been suggested that the piezoelectric coefficient varies as a function of position within the layer, though no direct evidence has been previously presented. In this study, the results of Moire interferometry investigations of local strains within these devices are reviewed. The technique permits effective depth-profiling of local deformations at …