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Articles 1 - 2 of 2
Full-Text Articles in Engineering
Photoluminescence Studies Of Amorphous Boron Carbide And Tungsten Diselenide Thin Films, David M. Allendorfer
Photoluminescence Studies Of Amorphous Boron Carbide And Tungsten Diselenide Thin Films, David M. Allendorfer
Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research
For many years scientists and engineers have been researching semi-conducting materials for use in a broad array of electronic devices. With the growing demand for faster, smaller and more efficient electronics, new materials must be characterized and their properties quantified. The focus of this thesis is to develop a system to measure photoluminescence in opto-electronic materials. Photoluminescence measurements are important because it can give researchers valuable information about a material’s band structure. This thesis begins by presenting the carrier recombination mechanisms and how they apply to photoluminescence. A system was developed to measure photoluminescence spectroscopy. This system was tested with …
Vector Magneto-Optical Generalized Ellipsometry For Determining Magneto-Optical Properties Of Thin Films, Chad Briley
Vector Magneto-Optical Generalized Ellipsometry For Determining Magneto-Optical Properties Of Thin Films, Chad Briley
Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research
Modern growth techniques allow for highly complex nano scale thin films to be created. These new films possess highly anisotropic properties structurally, optically, and magnetically that are significantly different from that of their bulk counterparts and must be accurately characterized in order to optimize desired properties for applications in next generation devices. Current magnetometry techniques focus on high symmetry characterization, namely in and out of the sample plane, and therefore do not possess the capabilities to fully explore these anisotropic properties without complicated setups and multiple sample manipulations. The author describes a setup that combines generalized ellipsometry with an octu-pole …