Engineering Commons^™

A Computer Model For Analysis Of Alternative Burley Tobacco Harvesting Practice, Thomas C. Bridges, Larry G. Wells, George A. Duncan, Larry D. Swetnam

Agricultural Engineering Extension Publications

Agricultural operations and practices have been the subject of many computer models and simulations. Holtman et al. (1970) developed a corn harvesting simulator, and Morey et al. (1971) used simulation techniques to analyze net profit of a corn harvesting and handling system during a particular weather year. Further, Loewer et al. (1977) advanced a model that assessed alternative beef production strategies for the individual farm with land, energy and capital as constraints. Bridges et al., (1979) developed a design simulation oriented toward the individual producer that examines corn harvesting systems and compares them regarding investment and annual cost. The CATCH …

Analysis Of Vertebrate Pest Research, Jim Hone

Proceedings of the Seventeenth Vertebrate Pest Conference 1996

Research on vertebrate pest control is mostly empirical, focusing on control of species X in location Y using method Z. Such an approach is needed. The science of vertebrate pest research is developing some generalizations across species, locations, and methods. This paper further explores such generalizations by discussing six questions asked by Hone (1994), the answers to which are relevant to vertebrate pest research world-wide. Several case studies are examined, with emphasis on control of damage by small mammals and predation control. Suggestions are made for future research.

Surface Charge Analysis (Sca) Of 300 Angstrom Thermally Grown Oxides, Briand D. Handel

Journal of the Microelectronic Engineering Conference

As the microelectronic industry progresses toward smaller devices, a decrease in the thickness of gate oxides accompanies them. High quality cannot be sacrificed as a result of this shrinkage. It is believed that oxide quality can be related to oxide charge density. Total oxide charge is related to a shift in Vt for transistors and believed to be related to oxide breakdown strength.

A surface charge analyzer on loan from the SemiTest Corp. was used to quantify oxide charge densities after thermal oxidation of 300 A oxides under various processing conditions. Variations to the base process included the temperature at …