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Full-Text Articles in Engineering
Mapping Of Fresnel’S Interface Reflection Coefficients Between Normal And Oblique Incidence: Results For The Parallel And Perpendicular Polarizations At Several Angles Of Incidence, Rasheed M.A. Azzam
Mapping Of Fresnel’S Interface Reflection Coefficients Between Normal And Oblique Incidence: Results For The Parallel And Perpendicular Polarizations At Several Angles Of Incidence, Rasheed M.A. Azzam
Electrical Engineering Faculty Publications
The functions, w = ƒ(z), that describe the transformation of Fresnel’s reflection coefficients of parallel and perpendicularly polarized light between normal and oblique incidence, as well as their inverses, z = g(w), are studied in detail as conformal mappings between the complex z and w planes for angles of incidence of 15, 30, 45, 60, and 75°. New nomograms are obtained for the determination of optical properties of absorbing isotropic and anisotropic media from measurements of reflectances of s- or p-polarized light at normal and oblique incidence.
Determination Of The Optic Axis And Optical Properties Of Absorbing Uniaxial Crystals By Reflection Perpendicularincidence Ellipsometry On Wedge Samples, Rasheed M.A. Azzam
Determination Of The Optic Axis And Optical Properties Of Absorbing Uniaxial Crystals By Reflection Perpendicularincidence Ellipsometry On Wedge Samples, Rasheed M.A. Azzam
Electrical Engineering Faculty Publications
Given an arbitrarily cut uniaxial crystal wedge, a procedure is described using reflection perpendicular-incidence ellipsometry (PIE) for (1) locating the optic axis, and (2) determining the ordinary (No) and extraordinary (Ne) complex refractive indices. The optic axis is located by finding the principal directions of the two wedge faces and subsequently solving three spherical triangles. No and Ne are determined by two complex ratios of principal reflection coefficients (of light normally incident on and linearly polarized along the principal directions of each face) as measured by PIE. The solution for No and N …
Inversion Of The Nonlinear Equations Of Reflection Ellipsometry For Uniaxial Crystals In Symmetrical Orientations, M. Elshazly-Zaghloul, R. M.A. Azzam
Inversion Of The Nonlinear Equations Of Reflection Ellipsometry For Uniaxial Crystals In Symmetrical Orientations, M. Elshazly-Zaghloul, R. M.A. Azzam
Electrical Engineering Faculty Publications
The complex ordinary (No) and extraordinary (Ne) refractive indices of an absorbing uniaxial crystal can be determined using reflection ellipsometry. The measurements are taken with the optic axis parallel and perpendicular to the crystal’s surface. The equations obtained are solved without resort to iterative methods; No and Ne are determined separately. Sixteen solution sets (No, Ne) are obtained and the correct solution can be easily identified. We present an optimum angle of incidence that minimizes the relative errors in No and Ne.