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Full-Text Articles in Engineering
Design Of Film-Substrate Single-Reflection Linear Partial Polarizers, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Design Of Film-Substrate Single-Reflection Linear Partial Polarizers, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
The results of a preceding paper [J. Opt. Soc. Am. 65, 1464,(1975)] are viewed from a different angleas providing the basis for the design of film-substrate single-reflection linear partial polarizers (LPP),which also operate as reflection optical rotators. The important characteristics of a comprehensive set of discrete designs of SiO2-Si LPP’s at λ = 6328 Å are shown graphically.
Polarizer-Surface-Analyzer Null Ellipsometry For Film-Substrate Systems, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Polarizer-Surface-Analyzer Null Ellipsometry For Film-Substrate Systems, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
Single-pass polarizer-surface-analyzer null ellipsometry (PSA-NE) can be used to characterize film-substrate systems, provided that the film thickness lies within one of a set of permissible-thickness bands (PTB). For a transparent film on a transparent or absorbing substrate, the PTB structure consists of a small number of finite-bandwidth bands followed by a continuum band that extends from a film thickness of about half the wavelength of light to infinity. We show that this band structure is a direct consequence of the periodicity of the ellipsometric function ρ (the ratio Rp/Rs, of the complex amplitude-reflection coefficients for …
Design Of Film—Substrate Single-Reflection Retarders, A.-R. M. Zaghloul, R. M.A. Azzam, N. M. Bashara
Design Of Film—Substrate Single-Reflection Retarders, A.-R. M. Zaghloul, R. M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
The design steps for film—substrate single-reflection retarders are briefly stated and applied to the SiO2—Si film—substrate system at wavelength 6328 Å. The criterion of minimum-maximum error of the ellipsometric angle ψ is used to choose angle-of-incidence-tunable designs. Use is made of the (Φ-d) plane (angle of incidence versus thickness) to determine whether a given film—substrate system with known optical properties and film thickness can operate as a reflection retarder and to determine the associated angles of incidence and retardation angles. This leads to the concept of permissible-thickness bands and forbidden gaps for operation of a film—substrate …
17th Annual Rocky Mountain Spectroscopy Conference
17th Annual Rocky Mountain Spectroscopy Conference
Rocky Mountain Conference on Magnetic Resonance
Final program and abstracts from the 17th annual meeting of the Rocky Mountain Spectroscopy Conference, sponsored by the Rocky Mountain Section of the Society for Applied Spectroscopy. Held in Denver, Colorado, August 4-8, 1975.
Damage Analysis Modified Trac Computer Program (Damtrac), George H. Baker Iii, Alan D. Mcnutt, G. Bradford Shea, David M. Rubenstein
Damage Analysis Modified Trac Computer Program (Damtrac), George H. Baker Iii, Alan D. Mcnutt, G. Bradford Shea, David M. Rubenstein
Department of Integrated Science and Technology - Faculty Scholarship
A computer program tailored for EMP damage analysis of solid-state circuitry has been developed by modifying the existing TRAC network analysis program. Modification of the TRAC diode and transistor models to include breakdown parameters and the addition of a semiconductor device parameter library have greatly simplified the analyst's task. An added feature is a subroutine that automatically calculates the amplitude and duration of transient power dissipated in electronic circuit components.
Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara
Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
No abstract provided.
Ellipsometric Function Of A Film-Substrate System: Applications To The Design Of Reflection-Type Optical Devices And To Ellipsometry, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Ellipsometric Function Of A Film-Substrate System: Applications To The Design Of Reflection-Type Optical Devices And To Ellipsometry, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
The ratio ρ = Rp/Rs of the complex amplitude-reflection coefficients Rp and Rs for light polarized parallel (p) and perpendicular (s) to the plane of incidence, reflected from an optically isotropic film-substrate system, is investigated as a function of the angle of incidence ϕ and the film thickness d. Both constant-angle-of-incidence contours (CAIC) and constant-thickness contours (CTC) of the ellipsometric function ρ(ϕ,d) in the complex ρ plane are examined. For transparent films, ρ(ϕ,d) is a periodic function of d with period Dϕ that is a function of ϕ. …
Photoionization Of The 6p32,122 Fine-Structure Levels In Cesium, Kaare J. Nygaard, Robert E. Hebner, James A. Jones, Robert J. Corbin
Photoionization Of The 6p32,122 Fine-Structure Levels In Cesium, Kaare J. Nygaard, Robert E. Hebner, James A. Jones, Robert J. Corbin
Physics Faculty Research & Creative Works
The relative photoionization cross sections for cesium atoms selectively excited to the 6P32,122 states have been measured in a triple-crossed-beam experiment. A cesium discharge lamp produced resonant wavelengths of 8521 and 8944 for the excitation process. A Hg-Xe lamp combined with a grating monochromator was used for the actual ionization in the wavelength region from 2500 to 5000. Background counts due to photoionization of ground-state cesium atoms and dimers as well as various surface effects were discriminated against by chopping the excitation light source. The data are compared with results from radiative-recombination measurements in which the fine-structure levels are not …
Analogy Between Spinodal Decomposition And Martensitic Transformation, Tetsuro Suzuki, Manfred Wuttig
Analogy Between Spinodal Decomposition And Martensitic Transformation, Tetsuro Suzuki, Manfred Wuttig
Physics Faculty Research & Creative Works
The translation of the theory developed for the spinodal decomposition of a supercooled alloy to the language appropriate for the martensitic transformation is carried out. In the spinodal theory, the stability of the alloy with respect to the composition fluctuation is examined, while in the present theory the stability of the crystal with respect to the shear displacement fluctuation, the transverse phonon, is studied. The analogy to the spinodal theory requires the revival of the strain gradient energy term or the couple stress term, the presence of which has been a subject of controversies for a long time since Laval. …
Measurement Of Growth Rate To Determine Condensation Coefficients For Water Drops Grown On Natural Cloud Nuclei., A. M. Sinnarwalla, Darryl J. Alofs, J. C. Carstens
Measurement Of Growth Rate To Determine Condensation Coefficients For Water Drops Grown On Natural Cloud Nuclei., A. M. Sinnarwalla, Darryl J. Alofs, J. C. Carstens
Mechanical and Aerospace Engineering Faculty Research & Creative Works
Growth Rate Measurements Were Made for Water Drops Grown on Nuclei in Atmospheric Air Samples Taken in Rolla, Missouri. Rolla, Having a Population of 15,000 and Very Little Industry, is Relatively Free of Urban Pollutants. the Measurements Were Made in a Vertical Flow Thermal Diffusion Chamber at Supersaturations of 0. 5 and 1%. the Time to Grow from Near Dry Radius to the Final Radius (6 to 7. 5 Mu M) Was Measured. If One Assumes the Thermal Accomodation Coefficient is Unity, the Measurements Indicate an Average Value of 0. 026 for the Condensation Coefficient. the Temperature Ranged from 22. …