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Electrical and Computer Engineering
Missouri University of Science and Technology
<p>Electromagnetic interference<br />Metal oxide semiconductors
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Far-Field Prediction Using Only Magnetic Near-Field Scanning And Modeling Delay Variations In Cmos Digital Logic Circuits Due To Electrical Disturbances In The Power Supply, Xu Gao
Doctoral Dissertations
"The first topic of this dissertation is far-field prediction using only magnetic near-field scanning. Near-field scanning has been used extensively for the far-field estimation of antennas. Applied to electromagnetic compatibility (EMC) problems, near-field scanning has been used to estimate emissions from both integrated circuits (ICs) and printed circuit boards (PCBs). Interest in applying far-field predictions using near-field to EMI/EMC problems has recently grown. To predict the far-field emissions from a PCB in the top half space, the near-field data on a planar surface above PCB usually is sufficient. However, near-field measurement on only one planar surface may not be enough …