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34th Rocky Mountain Conference On Applied Spectroscopy
34th Rocky Mountain Conference On Applied Spectroscopy
Rocky Mountain Conference on Magnetic Resonance
Program and registration information for the 34th annual meeting of the Rocky Mountain Conference on Applied Spectroscopy, co-sponsored by the Colorado Section of the American Chemical Society and the Rocky Mountain Section of the Society for Applied Spectroscopy. Held in Denver, Colorado, August 2-6, 1992.
Application Of Stable Operating Criterion To Grating Tuned Strong External Feedback Semiconductor Lasers, Haiyin Sun, Malay K. Mazumder
Application Of Stable Operating Criterion To Grating Tuned Strong External Feedback Semiconductor Lasers, Haiyin Sun, Malay K. Mazumder
Journal of the Arkansas Academy of Science
Stability analysis is done by applying criterion dnQ((o)/cfco>0 for grating tuned strong external feedback semiconductor lasers. The resulting stable and unstable operating ranges agree well with experiment results.
Techniques For Efficiency Calibration Of Photon Detectors For X-Rays And Low Energy Gamma Rays, Rahul Mehta
Techniques For Efficiency Calibration Of Photon Detectors For X-Rays And Low Energy Gamma Rays, Rahul Mehta
Journal of the Arkansas Academy of Science
No abstract provided.
Measurement Of The Coefficient Of Thermal Expansion Of Superconducting Thin Films Using Powder X-Ray Diffraction, Biju Chandran, R. Calvin Goforth, S. Nasrazadani
Measurement Of The Coefficient Of Thermal Expansion Of Superconducting Thin Films Using Powder X-Ray Diffraction, Biju Chandran, R. Calvin Goforth, S. Nasrazadani
Journal of the Arkansas Academy of Science
The High Density Electronics Center (HiDEC) at the University of Arkansas, Fayetteville is developing the technology for High Temperature Superconductor Multi-Chip Modules (HTSC-MCM's). As part of this work, we are looking at the mechanical properties of HTSC materials. An important mechanical property which influences the mechanical integrity of the hybrid MCMis the coefficient of thermal expansion (CTE) of the HTSC films. As a first step in developing a procedure for the determination of the CTE of HTSC materials, the lattice parameters and the CTE of an alpha-alumina substrate have been determined by powder x-ray diffraction technique. An extension of this …