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Full-Text Articles in Engineering
Automated Near-Field Scanning To Identify Resonances, Giorgi Muchaidze, Huang Wei, Jin Min, Shao Peng, James L. Drewniak, David Pommerenke
Automated Near-Field Scanning To Identify Resonances, Giorgi Muchaidze, Huang Wei, Jin Min, Shao Peng, James L. Drewniak, David Pommerenke
Electrical and Computer Engineering Faculty Research & Creative Works
Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.
Time Synchronized Near-Field And Far-Field For Emi Source Identification, Gang Feng, Wei Wu, David Pommerenke, Jun Fan, Daryl G. Beetner
Time Synchronized Near-Field And Far-Field For Emi Source Identification, Gang Feng, Wei Wu, David Pommerenke, Jun Fan, Daryl G. Beetner
Electrical and Computer Engineering Faculty Research & Creative Works
The evaluation of a product in terms of radiated emissions involves identifying the noise sources. Spectrum analyzer (SA) measurements alone are unable to identify noise sources when multiple sources are responsible for emissions at a particular frequency. In this paper, an approach using combined near-field and far-field measurements is proposed. This method consists of recording signals from a near field probe and from an antenna in the far-field using a high speed oscilloscope and analyzing the relationship between them via different post processing methods. The noise source can be identified by varying the location of near-field probe and searching for …