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Full-Text Articles in Engineering
Determination Of High Frequency Package Currents From Near-Field Scan Data, Xiaopeng Dong, Shaowei Deng, Daryl G. Beetner, Todd H. Hubing, Thomas Van Doren
Determination Of High Frequency Package Currents From Near-Field Scan Data, Xiaopeng Dong, Shaowei Deng, Daryl G. Beetner, Todd H. Hubing, Thomas Van Doren
Electrical and Computer Engineering Faculty Research & Creative Works
Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems. Near-field magnetic scanning is an effective tool for measuring the current distribution in IC packages and investigating chiplevel EMI problems. This paper discusses analysis of near-magnetic field scan data using tangential and normal field measurements. Results show that combining near-field scan results from probes with multiple orientations is an effective way to identify the current paths in IC packages.
Calibration And Compensation Of Near-Field Scan Measurements, Masahiro Yamaguchi, Richard E. Dubroff, Kevin P. Slattery, Michael A. Cracraft, Jin Shi
Calibration And Compensation Of Near-Field Scan Measurements, Masahiro Yamaguchi, Richard E. Dubroff, Kevin P. Slattery, Michael A. Cracraft, Jin Shi
Electrical and Computer Engineering Faculty Research & Creative Works
A procedure for the calibration and compensation of near-field scanning is described and demonstrated. Ultimately, the objective is to quantify the individual field components associated with electromagnetic interference (EMI) from high speed circuitry and devices. Specific examples of these methods are shown. The effects of compensation are small but noticeable when the uncompensated output signal from near field scanning is already a very good representation of the field being measured. In other cases, the improvement provided by compensation can be significant when the uncompensated output signal bears little resemblance to the underlying field.